Ryuji Kono

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Ibaraki-ken, JP

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Patents Grantslast 30 patents

Information Patent Grant
Connection device and test system
- Patent number 7,541,202
- Issue date Jun 2, 2009
- Renesas Technology Corp.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Connection device and test system
- Patent number 7,285,430
- Issue date Oct 23, 2007
- Hitachi, Ltd.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor apparatus
- Patent number 7,119,362
- Issue date Oct 10, 2006
- Renesas Technology Corp.
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Grant
Connection device and test system
- Patent number 6,759,258
- Issue date Jul 6, 2004
- Renesas Technology Corp.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 6,573,112
- Issue date Jun 3, 2003
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for manufacturing semiconductor device
- Patent number 6,511,857
- Issue date Jan 28, 2003
- Hitachi, Ltd.
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 6,479,305
- Issue date Nov 12, 2002
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connector and probing system
- Patent number 6,305,230
- Issue date Oct 23, 2001
- Hitachi, Ltd.
- Susumu Kasukabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONNECTION DEVICE AND TEST SYSTEM
- Publication number 20090209053
- Publication date Aug 20, 2009
- Susumu KASUKABE
- G01 - MEASURING TESTING
Information Patent Application
CONNECTION DEVICE AND TEST SYSTEM
- Publication number 20080009082
- Publication date Jan 10, 2008
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
Connection device and test system
- Publication number 20040235207
- Publication date Nov 25, 2004
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing semiconductor apparatus
- Publication number 20030092206
- Publication date May 15, 2003
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device manufacturing method
- Publication number 20030027365
- Publication date Feb 6, 2003
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Connection device and test system
- Publication number 20020129323
- Publication date Sep 12, 2002
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
- Publication number 20020064893
- Publication date May 30, 2002
- RYUJI KONO
- H01 - BASIC ELECTRIC ELEMENTS