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Ryunosuke GANDO

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  • Yokohama, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Resonance frequency detector and sensing device
    • Patent number 12,095,469
    • Issue date Sep 17, 2024
    • Kabushiki Kaisha Toshiba
    • Tetsuro Itakura
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 12,019,092
    • Issue date Jun 25, 2024
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,834,326
    • Issue date Dec 5, 2023
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,796,319
    • Issue date Oct 24, 2023
    • Kabushiki Kaisha Toshiba
    • Fumito Miyazaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,680,800
    • Issue date Jun 20, 2023
    • Kabushiki Kaisha Toshiba
    • Ryunosuke Gando
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,656,079
    • Issue date May 23, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroki Hiraga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,630,121
    • Issue date Apr 18, 2023
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor and electronic device
    • Patent number 11,531,042
    • Issue date Dec 20, 2022
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Sensor
    • Patent number 11,402,209
    • Issue date Aug 2, 2022
    • Kabushiki Kaisha Toshiba
    • Shiori Kaji
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor
    • Patent number 11,193,769
    • Issue date Dec 7, 2021
    • KABUSHIKl KAISHA TOSHIBA
    • Ryunosuke Gando
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Vibration device and method for controlling the same
    • Patent number 11,092,440
    • Issue date Aug 17, 2021
    • Kabushikikaisha Toshiba
    • Ryunosuke Gando
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Sensor device employing MEMS
    • Patent number 10,760,910
    • Issue date Sep 1, 2020
    • Kabushiki Kaisha Toshiba
    • Ryunosuke Gando
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Vibration device
    • Patent number 10,541,671
    • Issue date Jan 21, 2020
    • Kabushiki Kaisha Toshiba
    • Tamio Ikehashi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240060777
    • Publication date Feb 22, 2024
    • Kabushiki Kaisha Toshiba
    • Fumito MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240019248
    • Publication date Jan 18, 2024
    • Kabushiki Kaisha Toshiba
    • Hiroki HIRAGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230288202
    • Publication date Sep 14, 2023
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND MOVABLE BODY
    • Publication number 20230288445
    • Publication date Sep 14, 2023
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR
    • Publication number 20230280163
    • Publication date Sep 7, 2023
    • Kabushiki Kaisha Toshiba
    • Shiori KAJI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR
    • Publication number 20230266123
    • Publication date Aug 24, 2023
    • Kabushiki Kaisha Toshiba
    • Shiori KAJI
    • G01 - MEASURING TESTING
  • Information Patent Application

    RESONANCE FREQUENCY DETECTOR AND SENSING DEVICE
    • Publication number 20230253972
    • Publication date Aug 10, 2023
    • Kabushiki Kaisha Toshiba
    • Tetsuro ITAKURA
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230152099
    • Publication date May 18, 2023
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230152097
    • Publication date May 18, 2023
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    ATTITUDE ANGLE DERIVATION DEVICE AND ATTITUDE ANGLE SENSOR
    • Publication number 20230143243
    • Publication date May 11, 2023
    • Kabushiki Kaisha Toshiba
    • Daiki ONO
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHASE LOCKED LOOP AND SENSING DEVICE
    • Publication number 20230125664
    • Publication date Apr 27, 2023
    • Kabushiki Kaisha Toshiba
    • Tetsuro ITAKURA
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230062441
    • Publication date Mar 2, 2023
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220326013
    • Publication date Oct 13, 2022
    • Kabushiki Kaisha Toshiba
    • Fumito MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220276052
    • Publication date Sep 1, 2022
    • Kabushiki Kaisha Toshiba
    • Hiroki HIRAGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220268583
    • Publication date Aug 25, 2022
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220259035
    • Publication date Aug 18, 2022
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220137085
    • Publication date May 5, 2022
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20210396780
    • Publication date Dec 23, 2021
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20210381831
    • Publication date Dec 9, 2021
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR
    • Publication number 20200363205
    • Publication date Nov 19, 2020
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR
    • Publication number 20200284582
    • Publication date Sep 10, 2020
    • Kabushiki Kaisha Toshiba
    • Shiori KAJI
    • G01 - MEASURING TESTING
  • Information Patent Application

    VIBRATION DEVICE AND METHOD FOR CONTROLLING THE SAME
    • Publication number 20190204081
    • Publication date Jul 4, 2019
    • Kabushiki Kaisha Toshiba
    • Ryunosuke Gando
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20190078886
    • Publication date Mar 14, 2019
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    VIBRATION DEVICE
    • Publication number 20180167053
    • Publication date Jun 14, 2018
    • Kabushiki Kaisha Toshiba
    • Tamio IKEHASHI
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    SENSOR
    • Publication number 20170108391
    • Publication date Apr 20, 2017
    • Kabushiki Kaisha Toshiba
    • Tamio IKEHASHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    VARIABLE CAPACITANCE BANK DEVICE
    • Publication number 20160268052
    • Publication date Sep 15, 2016
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SENSOR AND SENSOR SYSTEM
    • Publication number 20160265986
    • Publication date Sep 15, 2016
    • Kabushiki Kaisha Toshiba
    • Daiki ONO
    • G01 - MEASURING TESTING
  • Information Patent Application

    PRESSURE SENSOR AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20150292970
    • Publication date Oct 15, 2015
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING