S. Daniel Miller

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Gilroy, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Flat panel display substrate testing system
- Patent number 7,941,237
- Issue date May 10, 2011
- Multibeam Corporation
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Grant
Detector optics for multiple electron beam test system
- Patent number 7,456,402
- Issue date Nov 25, 2008
- Multibeam Systems, Inc.
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-column charged particle optics assembly
- Patent number 6,943,351
- Issue date Sep 13, 2005
- Multibeam Systems, Inc.
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Platform positioning system
- Patent number 6,872,958
- Issue date Mar 29, 2005
- Multibeam Systems, Inc.
- Gerry B. Andeen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing system for multi-beam inspection
- Patent number 6,738,506
- Issue date May 18, 2004
- Multibeam Systems, Inc.
- S. Daniel Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-beam multi-column electron beam inspection system
- Patent number 6,734,428
- Issue date May 11, 2004
- Multibeam Systems, Inc.
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
Flat Panel Display Substrate Testing System
- Publication number 20080232939
- Publication date Sep 25, 2008
- N. William Parker
- G02 - OPTICS
Information Patent Application
Multiple loadlocks and processing chamber
- Publication number 20060177288
- Publication date Aug 10, 2006
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector optics for multiple electron beam test system
- Publication number 20060169899
- Publication date Aug 3, 2006
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-column charged particle optics assembly
- Publication number 20050001178
- Publication date Jan 6, 2005
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-beam multi-column electron beam inspection system
- Publication number 20030066963
- Publication date Apr 10, 2003
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Image processing system for multi-beam inspection
- Publication number 20020167487
- Publication date Nov 14, 2002
- S. Daniel Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Platform positioning system
- Publication number 20020127050
- Publication date Sep 12, 2002
- Gerry B. Andeen
- H01 - BASIC ELECTRIC ELEMENTS