Sadao Shimoyashiro

Person

Fujisawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection data analyzing system
- Patent number 6,628,817
- Issue date Sep 30, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,529,619
- Issue date Mar 4, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,339,653
- Issue date Jan 15, 2002
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,330,352
- Issue date Dec 11, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method using separate processors for processi...
- Patent number 6,185,322
- Issue date Feb 6, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 5,841,893
- Issue date Nov 24, 1998
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for diagnosis and analysis of products troubles
- Patent number 5,596,712
- Issue date Jan 21, 1997
- Hitachi, Ltd.
- Tsutomu Tsuyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for carrying a variety of products
- Patent number 5,536,128
- Issue date Jul 16, 1996
- Hitachi, Ltd.
- Sadao Shimoyashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diagnostic support system and diagnostic system of equipment
- Patent number 5,319,580
- Issue date Jun 7, 1994
- Hitachi, Ltd.
- Masao Sakata
- G07 - CHECKING-DEVICES
Information Patent Grant
Integrated quality control method and system
- Patent number 5,245,554
- Issue date Sep 14, 1993
- Hitachi, Ltd.
- Tsutomu Tsuyama
- G07 - CHECKING-DEVICES
Information Patent Grant
Production system with order of processing determination
- Patent number 5,164,905
- Issue date Nov 17, 1992
- Hitachi, Ltd.
- Takemasa Iwasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Production system using wafer-like carrier jig
- Patent number 5,100,276
- Issue date Mar 31, 1992
- Hitachi, Ltd.
- Takemasa Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simulation method for modifiable simulation model
- Patent number 4,967,386
- Issue date Oct 30, 1990
- Hitachi, Ltd.
- Kazuhiko Maeda
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Production line constructing system
- Publication number 20020064440
- Publication date May 30, 2002
- Minoru Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection data analyzing system
- Publication number 20020034326
- Publication date Mar 21, 2002
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analyzing system
- Publication number 20010038708
- Publication date Nov 8, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analyzing system
- Publication number 20010001015
- Publication date May 10, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING

Sadao Shimoyashiro

Person

Patents Grantslast 30 patents

Inspection data analyzing system

Inspection data analyzing system

Inspection data analyzing system

Inspection data analyzing system

Inspection system and method using separate processors for processi...

Inspection data analyzing system

Method and system for diagnosis and analysis of products troubles

Method and apparatus for carrying a variety of products

Diagnostic support system and diagnostic system of equipment

Integrated quality control method and system

Production system with order of processing determination

Production system using wafer-like carrier jig

Simulation method for modifiable simulation model

Patents Applicationslast 30 patents

Production line constructing system

Inspection data analyzing system

Inspection data analyzing system

Inspection data analyzing system