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Sakiko SHIMIZU
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Matsumoto, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Heat flow meter and electronic device
Patent number
10,260,965
Issue date
Apr 16, 2019
Seiko Epson Corporation
Akira Ikeda
G01 - MEASURING TESTING
Information
Patent Grant
Internal temperature measuring device, wrist mounting-type device,...
Patent number
10,209,209
Issue date
Feb 19, 2019
Seiko Epson Corporation
Akira Ikeda
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Temperature measurement apparatus and temperature measurement method
Patent number
9,952,105
Issue date
Apr 24, 2018
Seiko Epson Corporation
Sakiko Shimizu
G01 - MEASURING TESTING
Information
Patent Grant
Temperature measurement device
Patent number
9,528,887
Issue date
Dec 27, 2016
Seiko Epson Corporation
Sakiko Shimizu
G01 - MEASURING TESTING
Information
Patent Grant
Thermometer and temperature measurement method
Patent number
9,068,898
Issue date
Jun 30, 2015
Seiko Epson Corporation
Sakiko Shimizu
G01 - MEASURING TESTING
Information
Patent Grant
Temperature measurement device and temperature measuring method
Patent number
9,015,001
Issue date
Apr 21, 2015
Seiko Epson Corporation
Sakiko Shimizu
G01 - MEASURING TESTING
Information
Patent Grant
Thermometer and temperature measurement method
Patent number
8,725,444
Issue date
May 13, 2014
Seiko Epson Corporation
Sakiko Shimizu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEMPERATURE-MEASURING APPARATUS, INSPECTION APPARATUS, AND CONTROL...
Publication number
20180136275
Publication date
May 17, 2018
SEIKO EPSON CORPORATION
Sakiko SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE-MEASURING APPARATUS, INSPECTION APPARATUS, AND CONTROL...
Publication number
20180136276
Publication date
May 17, 2018
SEIKO EPSON CORPORATION
Sakiko SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
BIOLOGICAL CLOCK TIME CALCULATING APPARATUS AND BIOLOGICAL CLOCK TI...
Publication number
20180039749
Publication date
Feb 8, 2018
SEIKO EPSON CORPORATION
Akira IKEDA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTERNAL TEMPERATURE MEASURING DEVICE, WRIST MOUNTING-TYPE DEVICE,...
Publication number
20170184523
Publication date
Jun 29, 2017
SEIKO EPSON CORPORATION
Akira IKEDA
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE MEASUREMENT APPARATUS AND TEMPERATURE MEASUREMENT METHOD
Publication number
20160258823
Publication date
Sep 8, 2016
SEIKO EPSON CORPORATION
Sakiko SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
HEAT FLOW METER AND ELECTRONIC DEVICE
Publication number
20160252407
Publication date
Sep 1, 2016
SEIKO EPSON CORPORATION
Akira IKEDA
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL DETECTION METHOD, CALIBRATION CURVE CREATION METHOD, QUANTIF...
Publication number
20160097712
Publication date
Apr 7, 2016
SEIKO EPSON CORPORATION
Sakiko SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE MEASUREMENT APPARATUS AND TEMPERATURE MEASUREMENT METHOD
Publication number
20160069752
Publication date
Mar 10, 2016
SEIKO EPSON CORPORATION
Sakiko SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE MEASUREMENT DEVICE AND TEMPERATURE MEASURING METHOD
Publication number
20140343887
Publication date
Nov 20, 2014
Sakiko SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE MEASUREMENT DEVICE AND TEMPERATURE MEASUREMENT METHOD
Publication number
20140278201
Publication date
Sep 18, 2014
SEIKO EPSON CORPORATION
Sakiko SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
THERMOMETER AND TEMPERATURE MEASUREMENT METHOD
Publication number
20140233604
Publication date
Aug 21, 2014
SEIKO EPSON CORPORATION
Sakiko SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE MEASUREMENT DEVICE
Publication number
20120109571
Publication date
May 3, 2012
SEIKO EPSON CORPORATION
Sakiko SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE MEASUREMENT DEVICE AND TEMPERATURE MEASURING METHOD
Publication number
20120109572
Publication date
May 3, 2012
SEIKO EPSON CORPORATION
Sakiko SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
THERMOMETER AND TEMPERATURE MEASUREMENT METHOD
Publication number
20110224936
Publication date
Sep 15, 2011
SEIKO EPSON CORPORATION
Sakiko SHIMIZU
G01 - MEASURING TESTING