TREA

Salem Abdennadher

Follow

Person

  • Sacramento, CA, US
People

Patents Grantslast 30 patents

  • Information Patent Grant

    On-chip jitter testing
    • Patent number 7,409,621
    • Issue date Aug 5, 2008
    • Intel Corporation
    • Hassan Ihs
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing a multi-channel device
    • Patent number 7,088,091
    • Issue date Aug 8, 2006
    • Intel Corporation
    • Salem Abdennadher
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Circuit modeling
    • Patent number 6,868,534
    • Issue date Mar 15, 2005
    • Intel Corporation
    • Farag Fattouh
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    On-chip testing of integrated circuits
    • Patent number 6,836,872
    • Issue date Dec 28, 2004
    • Intel Corporation
    • Salem Abdennadher
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Analog filter with built-in self test
    • Patent number 6,777,921
    • Issue date Aug 17, 2004
    • Intel Corporation
    • Salem Abdennadher
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Timing variation measurements
    • Patent number 6,670,800
    • Issue date Dec 30, 2003
    • Intel Corporation
    • Chad Beach
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Testing a multi-channel device
    • Publication number 20050035753
    • Publication date Feb 17, 2005
    • Salem Abdennadher
    • G01 - MEASURING TESTING
  • Information Patent Application

    On-chip jitter testing
    • Publication number 20040128591
    • Publication date Jul 1, 2004
    • Hassan Ihs
    • G01 - MEASURING TESTING
  • Information Patent Application

    On-chip testing of integrated circuits
    • Publication number 20040060017
    • Publication date Mar 25, 2004
    • Salem Abdennadher
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Timing variation measurements
    • Publication number 20030210028
    • Publication date Nov 13, 2003
    • Chad Beach
    • G01 - MEASURING TESTING
  • Information Patent Application

    Circuit modeling
    • Publication number 20030177427
    • Publication date Sep 18, 2003
    • Farag Fattouh
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Analog filter with built-in self test
    • Publication number 20030141859
    • Publication date Jul 31, 2003
    • Salem Abdennadher
    • H03 - BASIC ELECTRONIC CIRCUITRY