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Salleh Ismail
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El Monte, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method of making thin film probe tip for atomic force microscopy
Patent number
8,689,361
Issue date
Apr 1, 2014
Oicmicro, LLC
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Grant
Wireless self-powered monolithic integrated capacitive sensor and m...
Patent number
8,316,717
Issue date
Nov 27, 2012
Rogue Valley Microdevices, Inc.
Salleh Ismail
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Probe head with machine mounting pads and method of forming same
Patent number
8,232,816
Issue date
Jul 31, 2012
Advantest America, Inc.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Grant
Micromachined flex interposers
Patent number
8,109,769
Issue date
Feb 7, 2012
Rogue Valley Microdevices
Salleh Ismail
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Post and tip design for a probe contact
Patent number
7,922,888
Issue date
Apr 12, 2011
Touchdown Technologies, Inc.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Grant
Torsion spring probe contactor design
Patent number
7,724,010
Issue date
May 25, 2010
Touchdown Technologies, Inc.
Melvin Khoo
G01 - MEASURING TESTING
Information
Patent Grant
Probe card substrate with bonded via
Patent number
7,692,436
Issue date
Apr 6, 2010
Touchdown Technologies, Inc.
Raffi Garabedian
G01 - MEASURING TESTING
Information
Patent Grant
Forked probe for testing semiconductor devices
Patent number
7,589,547
Issue date
Sep 15, 2009
Touchdown Technologies, Inc.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Grant
Torsion spring probe contactor design
Patent number
7,362,119
Issue date
Apr 22, 2008
Touchdown Technologies, Inc.
Melvin Khoo
G01 - MEASURING TESTING
Information
Patent Grant
Process for forming microstructures
Patent number
7,271,022
Issue date
Sep 18, 2007
Touchdown Technologies, Inc.
Weilong Tang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Process for forming MEMS
Patent number
7,264,984
Issue date
Sep 4, 2007
Touchdown Technologies, Inc.
Raffi Garabedian
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Post and tip design for a probe contact
Patent number
7,245,135
Issue date
Jul 17, 2007
Touchdown Technologies, Inc.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Grant
Probe head with machined mounting pads and method of forming same
Patent number
7,180,316
Issue date
Feb 20, 2007
Touchdown Technologies, Inc.
Salleh Ismail
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
WIRELESS SELF-POWERED MONOLITHIC INTEGRATED CAPACITIVE SENSOR AND M...
Publication number
20110314922
Publication date
Dec 29, 2011
ROGUE VALLEY MICRODEVICES, INC.
Salleh Ismail
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PROBE CARD SUBSTRATE WITH BONDED VIA
Publication number
20100308854
Publication date
Dec 9, 2010
TOUCHDOWN TECHNOLOGIES, INC.
Raffi Garabedian
G01 - MEASURING TESTING
Information
Patent Application
Probe card substrate with bonded via
Publication number
20090237099
Publication date
Sep 24, 2009
TOUCHDOWN TECHNOLOGIES, INC.
Raffi Garabedian
G01 - MEASURING TESTING
Information
Patent Application
Multi-Pivot Probe Card For Testing Semiconductor Devices
Publication number
20090072851
Publication date
Mar 19, 2009
TOUCHDOWN TECHNOLOGIES, INC.
Lakshmikanth Namburi
G01 - MEASURING TESTING
Information
Patent Application
FORKED PROBE FOR TESTING SEMICONDUCTOR DEVICES
Publication number
20090072850
Publication date
Mar 19, 2009
TOUCHDOWN TECHNOLOGIES, INC.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Application
Torsion spring probe contactor design
Publication number
20080106289
Publication date
May 8, 2008
TOUCHDOWN TECHNOLOGIES, INC.
Melvin Khoo
G01 - MEASURING TESTING
Information
Patent Application
Post and tip design for a probe contact
Publication number
20070240306
Publication date
Oct 18, 2007
TOUCHDOWN TECHNOLOGIES., INC.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Application
Probe head with machine mounting pads and method of forming same
Publication number
20070182430
Publication date
Aug 9, 2007
TOUCHDOWN TECHNOLOGIES, INC.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Application
Lateral interposer contact design and probe card assembly
Publication number
20070075717
Publication date
Apr 5, 2007
TOUCHDOWN TECHNOLOGIES, INC.
David Kinghorn
G01 - MEASURING TESTING
Information
Patent Application
Lateral interposer contact design and probe card assembly
Publication number
20070057685
Publication date
Mar 15, 2007
TOUCHDOWN TECHNOLOGIES, INC.
Raffi Garabedian
G01 - MEASURING TESTING
Information
Patent Application
Post and tip design for a probe contact
Publication number
20070024297
Publication date
Feb 1, 2007
TOUCHDOWN TECHNOLOGIES, INC.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Application
Torsion spring probe contactor design
Publication number
20070024298
Publication date
Feb 1, 2007
TOUCHDOWN TECHNOLOGIES, INC.
Melvin Khoo
G01 - MEASURING TESTING
Information
Patent Application
Process for forming microstructures
Publication number
20060134820
Publication date
Jun 22, 2006
TOUCHDOWN TECHNOLOGIES, INC.
Weilong Tang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Process for forming MEMS
Publication number
20060134819
Publication date
Jun 22, 2006
Integrated Micromachines, Inc.
Weilong Tang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Moving coil motor and implementations in MEMS based optical switches
Publication number
20020130561
Publication date
Sep 19, 2002
Viktoria A. Temesvary
G02 - OPTICS