TREA

Sankeerth RAJALINGAM

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  • Peekskill, NY, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Low-force wafer test probes
    • Patent number 11,131,689
    • Issue date Sep 28, 2021
    • International Business Machines Corporation
    • David M. Audette
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Organic probe substrate
    • Patent number 10,288,645
    • Issue date May 14, 2019
    • GLOBALFOUNDRIES Inc.
    • David M. Audette
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents