Sassan Tabatabaei

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Temperature-reporting oscillator
- Patent number 12,101,062
- Issue date Sep 24, 2024
- SiTime Corporation
- Sassan Tabatabaei
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Clock generator with dual-path temperature compensation
- Patent number 12,047,071
- Issue date Jul 23, 2024
- SiTime Corporation
- Saleh Heidary Shalmany
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual-MEMS device with temperature correction of MEMS output based o...
- Patent number 11,990,908
- Issue date May 21, 2024
- SiTime Corporation
- Aaron Partridge
- G01 - MEASURING TESTING
Information Patent Grant
Time module apparatus for use with fixed-beacon time transfer system
- Patent number 11,871,369
- Issue date Jan 9, 2024
- SiTime Corporation
- Markus Lutz
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Clock generator with dual-path temperature compensation
- Patent number 11,791,802
- Issue date Oct 17, 2023
- SiTime Corporation
- Saleh Heidary Shalmany
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low allan-deviation oscillator
- Patent number 11,716,055
- Issue date Aug 1, 2023
- SiTime Corporation
- Aaron Partridge
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Temperature-reporting oscillator
- Patent number 11,646,698
- Issue date May 9, 2023
- SiTime Corporation
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Grant
Clock generator with dual-path temperature compensation
- Patent number 11,528,014
- Issue date Dec 13, 2022
- SiTime Corporation
- Saleh Heidary Shalmany
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low Allan-Deviation oscillator
- Patent number 11,323,071
- Issue date May 3, 2022
- SiTime Corporation
- Aaron Partridge
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Temperature-reporting oscillator
- Patent number 11,245,361
- Issue date Feb 8, 2022
- SiTime Corporation
- Sassan Tabatabaei
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Clock generator with dual-path temperature compensation
- Patent number 11,228,302
- Issue date Jan 18, 2022
- SiTime Corporation
- Saleh Heidary Shalmany
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fixed-beacon time transfer system
- Patent number 11,218,984
- Issue date Jan 4, 2022
- SiTime Corporation
- Markus Lutz
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Low allan-deviation oscillator
- Patent number 11,005,422
- Issue date May 11, 2021
- SiTime Corporation
- Aaron Partridge
- G01 - MEASURING TESTING
Information Patent Grant
Clock generator with dual-path temperature compensation
- Patent number 10,979,031
- Issue date Apr 13, 2021
- SiTime Corporation
- Saleh Heidary Shalmany
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature-reporting oscillator
- Patent number 10,833,632
- Issue date Nov 10, 2020
- SiTime Corporation
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Grant
Low Allan-Deviation oscillator
- Patent number 10,622,945
- Issue date Apr 14, 2020
- SiTime Corporation
- Aaron Partridge
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensor based on ratio of clock signals from respective...
- Patent number 10,622,973
- Issue date Apr 14, 2020
- SiTime Corporation
- Aaron Partridge
- G01 - MEASURING TESTING
Information Patent Grant
Clock generator with dual-path temperature compensation
- Patent number 10,594,301
- Issue date Mar 17, 2020
- SiTime Corporation
- Saleh Heidary Shalmany
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High resolution temperature sensor
- Patent number 10,247,621
- Issue date Apr 2, 2019
- SiTime Corporation
- Aaron Partridge
- G01 - MEASURING TESTING
Information Patent Grant
Fast low frequency jitter rejection methodology
- Patent number 8,255,188
- Issue date Aug 28, 2012
- GuideTech, Inc.
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for external voltage test methodology of in...
- Patent number 8,225,156
- Issue date Jul 17, 2012
- Synopsys, Inc.
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Grant
High resolution time interpolator
- Patent number 8,064,293
- Issue date Nov 22, 2011
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Grant
Input-output device testing including initializing and leakage test...
- Patent number 8,032,806
- Issue date Oct 4, 2011
- Synopsys, Inc.
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Grant
Input-output device testing including voltage tests
- Patent number 8,032,805
- Issue date Oct 4, 2011
- Synopsys, Inc.
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Grant
Periodic jitter (PJ) measurement methodology
- Patent number 7,941,287
- Issue date May 10, 2011
- Sassan Tabatabaei
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods and apparatuses for external test methodology and initializ...
- Patent number 7,856,581
- Issue date Dec 21, 2010
- Synopsys, Inc.
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for external voltage test of input-output c...
- Patent number 7,853,847
- Issue date Dec 14, 2010
- Synopsys, Inc.
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Grant
Jitter spectrum analysis using random sampling (RS)
- Patent number 7,844,022
- Issue date Nov 30, 2010
- Guide Technology, Inc.
- Sassan Tabatabaei
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High resolution time interpolator
- Patent number 7,843,771
- Issue date Nov 30, 2010
- Guide Technology, Inc.
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Grant
Input-output device testing including delay tests
- Patent number 7,779,319
- Issue date Aug 17, 2010
- Virage Logic Corporation
- Sassan Tabatabaei
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High Resolution Time Interpolator
- Publication number 20110040509
- Publication date Feb 17, 2011
- Guide Technology, Inc.
- Sassan Tabatabaei
- G04 - HOROLOGY
Information Patent Application
High Resolution Time Interpolator
- Publication number 20090154300
- Publication date Jun 18, 2009
- Guide Technology, Inc.
- Sassan Tabatabaei
- G04 - HOROLOGY
Information Patent Application
Fast Low Frequency Jitter Rejection Methodology
- Publication number 20090132207
- Publication date May 21, 2009
- Guidetech, Inc.
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Application
Periodic Jitter (PJ) Measurement Methodology
- Publication number 20080319691
- Publication date Dec 25, 2008
- GuideTech Inc.
- Sassan Tabatabaei
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Periodic Jitter (PJ) Measurement Methodology
- Publication number 20080267274
- Publication date Oct 30, 2008
- GuideTech Inc.
- Sassan Tabatabaei
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Jitter spectrum analysis using random sampling (RS)
- Publication number 20070110146
- Publication date May 17, 2007
- Guide Technology, Inc.
- Sassan Tabatabaei
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Input-output device testing
- Publication number 20070079200
- Publication date Apr 5, 2007
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Application
Periodic jitter (PJ) measurement methodology
- Publication number 20060161361
- Publication date Jul 20, 2006
- Guide Technology, Inc.
- Sassan Tabatabaei
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Data-dependent jitter (DDJ) calibration methodology
- Publication number 20060120444
- Publication date Jun 8, 2006
- Sassan Tabatabaei
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System and method of generating test signals with injected data-dep...
- Publication number 20060100801
- Publication date May 11, 2006
- Guide Technology
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Application
System and method of obtaining data-dependent jitter (DDJ) estimate...
- Publication number 20060047450
- Publication date Mar 2, 2006
- Guide Technology
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Application
System and method of obtaining random jitter estimates from measure...
- Publication number 20050286627
- Publication date Dec 29, 2005
- Guide Technology
- Sassan Tabatabaei
- G01 - MEASURING TESTING

Sassan Tabatabaei

Person

Patents Grantslast 30 patents

Temperature-reporting oscillator

Clock generator with dual-path temperature compensation

Dual-MEMS device with temperature correction of MEMS output based o...

Time module apparatus for use with fixed-beacon time transfer system

Clock generator with dual-path temperature compensation

Low allan-deviation oscillator

Temperature-reporting oscillator

Clock generator with dual-path temperature compensation

Low Allan-Deviation oscillator

Temperature-reporting oscillator

Clock generator with dual-path temperature compensation

Fixed-beacon time transfer system

Low allan-deviation oscillator

Clock generator with dual-path temperature compensation

Temperature-reporting oscillator

Low Allan-Deviation oscillator

Temperature sensor based on ratio of clock signals from respective...

Clock generator with dual-path temperature compensation

High resolution temperature sensor

Fast low frequency jitter rejection methodology

Methods and apparatuses for external voltage test methodology of in...

High resolution time interpolator

Input-output device testing including initializing and leakage test...

Input-output device testing including voltage tests

Periodic jitter (PJ) measurement methodology

Methods and apparatuses for external test methodology and initializ...

Methods and apparatuses for external voltage test of input-output c...

Jitter spectrum analysis using random sampling (RS)

High resolution time interpolator

Input-output device testing including delay tests

Patents Applicationslast 30 patents

High Resolution Time Interpolator

High Resolution Time Interpolator

Fast Low Frequency Jitter Rejection Methodology

Periodic Jitter (PJ) Measurement Methodology

Periodic Jitter (PJ) Measurement Methodology

Jitter spectrum analysis using random sampling (RS)

Input-output device testing

Periodic jitter (PJ) measurement methodology

Data-dependent jitter (DDJ) calibration methodology

System and method of generating test signals with injected data-dep...

System and method of obtaining data-dependent jitter (DDJ) estimate...

System and method of obtaining random jitter estimates from measure...