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Satohiro HAMANO
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Tokyo, JP
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last 30 patents
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Patent Application
SAMPLE TRANSPORT SYSTEM
Publication number
20220252626
Publication date
Aug 11, 2022
HITACHI HIGH-TECH CORPORATION
Shigeru YANO
G01 - MEASURING TESTING
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Patent Application
SPECIMEN INSPECTION AUTOMATION SYSTEM AND SPECIMEN INSPECTION METHOD
Publication number
20220244280
Publication date
Aug 4, 2022
HITACHI HIGH-TECH CORPORATION
Satohiro HAMANO
G01 - MEASURING TESTING
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Patent Application
Specimen Inspection Automation System and Method for Managing Empty...
Publication number
20200241027
Publication date
Jul 30, 2020
Takeshi MATSUKA
G01 - MEASURING TESTING