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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Automatic analyzer
Patent number
10,732,192
Issue date
Aug 4, 2020
HITACHI HIGH-TECH CORPORATION
Satoru Chida
G01 - MEASURING TESTING
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Patent Grant
Automatic analyzer
Patent number
8,943,909
Issue date
Feb 3, 2015
Hitachi High-Technologies Corporation
Satoru Chida
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD AND SYSTEM OF MANAGING SAMPLE PRIORITIES
Publication number
20240013873
Publication date
Jan 11, 2024
Roche Diagnostics Operations, Inc.
Daniel Laubert
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
AUTOMATIC ANALYZER
Publication number
20210356483
Publication date
Nov 18, 2021
HITACHI HIGH-TECH CORPORATION
Satoru CHIDA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20170153261
Publication date
Jun 1, 2017
Hitachi High-Technologies Corporation
Satoru CHIDA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20120036944
Publication date
Feb 16, 2012
Hitachi High-Technologies Corporation
Satoru Chida
G01 - MEASURING TESTING