Satoshi Kishimoto

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor testing circuit and semiconductor testing method
- Patent number 7,733,112
- Issue date Jun 8, 2010
- Panasonic Corporation
- Satoshi Kishimoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TESTING CIRCUIT AND SEMICONDUCTOR TESTING METHOD
- Publication number 20090021279
- Publication date Jan 22, 2009
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Kishimoto
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor testing equipment and semiconductor testing method
- Publication number 20080094096
- Publication date Apr 24, 2008
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Kishimoto
- G01 - MEASURING TESTING
Information Patent Application
High-speed interface circuit test module, module under high-speed i...
- Publication number 20050258856
- Publication date Nov 24, 2005
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Kishimoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE