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Satoshi Shibuya

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Analysis method of automatic analyzer
    • Patent number 11,860,177
    • Issue date Jan 2, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi Shibuya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis system
    • Patent number 11,340,243
    • Issue date May 24, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi Shibuya
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Automated analysis system
    • Patent number 11,262,372
    • Issue date Mar 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi Shibuya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,746,755
    • Issue date Aug 18, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi Shibuya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,916,095
    • Issue date Dec 23, 2014
    • Hitachi High-Technologies Corporation
    • Satoshi Shibuya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,409,507
    • Issue date Apr 2, 2013
    • Hitachi High-Technologies Corporation
    • Hirokazu Iwamatsu
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20230228777
    • Publication date Jul 20, 2023
    • HITACH HIGH-TECH CORPORATION
    • Shunsuke Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL FIBER SUPPORT STRUCTURE AND SEMICONDUCTOR LASER MODULE
    • Publication number 20230198220
    • Publication date Jun 22, 2023
    • FURUKAWA ELECTRIC CO., LTD.
    • Masaya NAKAZUMI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SUPPORTING MEMBER, WAVELENGTH COMBINING MODULE, AND LIGHT EMITTING...
    • Publication number 20230024623
    • Publication date Jan 26, 2023
    • FURUKAWA ELECTRIC CO., LTD.
    • Satoshi SHIBUYA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Automated Analysis System
    • Publication number 20210123935
    • Publication date Apr 29, 2021
    • Hitachi High-Technologies Corporation
    • Satoshi SHIBUYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANALYSIS METHOD OF AUTOMATIC ANALYSER
    • Publication number 20200333367
    • Publication date Oct 22, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi SHIBUYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS SYSTEM
    • Publication number 20200049724
    • Publication date Feb 13, 2020
    • Hitachi High-Technologies Corporation
    • Satoshi SHIBUYA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYZER, AUTOMATIC ANALYSIS SYSTEM, AND DISPLAY METHOD O...
    • Publication number 20190227090
    • Publication date Jul 25, 2019
    • Hitachi High-Technologies Corporation
    • Hirofumi SASAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSER
    • Publication number 20180217173
    • Publication date Aug 2, 2018
    • Hitachi High-Technologies Corporation
    • Satoshi SHIBUYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND SUPPORT SYSTEM THEREFOR
    • Publication number 20110259129
    • Publication date Oct 27, 2011
    • Hitachi High-Technologies Corporation
    • Sumiko Murata
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20090142231
    • Publication date Jun 4, 2009
    • Satoshi SHIBUYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20080240989
    • Publication date Oct 2, 2008
    • Hirokazu IWAMATSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20040186360
    • Publication date Sep 23, 2004
    • Hiroyuki Suzuki
    • G01 - MEASURING TESTING