Satoshi YOKOTSUKA

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Patents Grantslast 30 patents

Information Patent Grant
Automatic analyzer with a control unit for displaying background ma...
- Patent number 12,111,327
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Satoru Chida
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 11,971,424
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuichi Hirabayashi
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 11,041,870
- Issue date Jun 22, 2021
- HITACHI HIGH-TECH CORPORATION
- Satoshi Yokotsuka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Automatic Analysis System and Information Takeover Method in Automa...
- Publication number 20240003924
- Publication date Jan 4, 2024
- Hitachi High-Tech Corporation
- Satoshi Yokotsuka
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE, DISPLAY SYSTEM OF AUTOMATIC ANALYSIS DEV...
- Publication number 20230056397
- Publication date Feb 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Kazuaki SHIBA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND MAINTENANCE GUIDE METHOD IN AUTOMATIC...
- Publication number 20220147038
- Publication date May 12, 2022
- HITACHI HIGH-TECH CORPORATION
- Masashi Akutsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20210356483
- Publication date Nov 18, 2021
- HITACHI HIGH-TECH CORPORATION
- Satoru CHIDA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20210025907
- Publication date Jan 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Yuichi HIRABAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analysis Device
- Publication number 20190011469
- Publication date Jan 10, 2019
- Hitachi High-Technologies Corporation
- Satoshi YOKOTSUKA
- G01 - MEASURING TESTING