Sébastien Gallois-Garreignot

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Grenoble, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method for determining a three-dimensional stress field of an objec...
- Patent number 9,638,589
- Issue date May 2, 2017
- STMicroelectronics S.A.
- Vincent Fiori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
PMOS transistor with improved mobility of the carriers
- Patent number 9,356,090
- Issue date May 31, 2016
- STMicroelectronics (Crolles 2) SAS
- Vincent Fiori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device comprising a crack stop structure
- Patent number 8,981,551
- Issue date Mar 17, 2015
- STMicroelectronics (Crolles 2) SAS
- Philippe Delpech
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PMOS TRANSISTOR WITH IMPROVED MOBILITY OF THE CARRIERS
- Publication number 20150311277
- Publication date Oct 29, 2015
- STMicroelectronics (Crolles 2) SAS
- Vincent Fiori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE COMPRISING AN INTEGRATED CIRCUIT CHIP PROVIDED WI...
- Publication number 20150022987
- Publication date Jan 22, 2015
- STMicroelectronics (Crolles 2) SAS
- Sebastien Gallois-Garreignot
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD FOR DETERMINING A THREE-DIMENSIONAL STRESS FIELD OF AN OBJEC...
- Publication number 20140373640
- Publication date Dec 25, 2014
- Vincent FIORI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE COMPRISING A CRACK STOP STRUCTURE
- Publication number 20140091451
- Publication date Apr 3, 2014
- STMicroelectronics (Crolles 2) SAS
- Philippe Delpech
- H01 - BASIC ELECTRIC ELEMENTS