Seiichiro Ishio

Person

Kariya-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Rotation detecting device using magnetic sensor
- Patent number 7,355,388
- Issue date Apr 8, 2008
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Current sensor having hall element
- Patent number 7,253,601
- Issue date Aug 7, 2007
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Rotation detecting apparatus
- Patent number 7,141,966
- Issue date Nov 28, 2006
- Denso Corporation
- Kazuyoshi Sumiya
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having SOI construction
- Patent number 7,105,910
- Issue date Sep 12, 2006
- Denso Corporation
- Seiichiro Ishio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor sensor having a diffused resistor
- Patent number 6,933,582
- Issue date Aug 23, 2005
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor
- Patent number 6,925,885
- Issue date Aug 9, 2005
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having bonding pads and probe pads
- Patent number 6,897,669
- Issue date May 24, 2005
- Denso Corporation
- Seiichiro Ishio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing semiconductor device
- Patent number 6,875,673
- Issue date Apr 5, 2005
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
METHOD OF MEASURING A CHARACTERISTIC OF A CAPACITIVE TYPE OF SENSOR...
- Patent number 6,809,527
- Issue date Oct 26, 2004
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Diaphragm-type semiconductor device and method for manufacturing di...
- Patent number 6,802,222
- Issue date Oct 12, 2004
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Diaphragm-type semiconductor pressure sensor
- Patent number 6,789,431
- Issue date Sep 14, 2004
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive sensor apparatus
- Patent number 6,744,258
- Issue date Jun 1, 2004
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic sensor having capacitance varying according to dynamic forc...
- Patent number 6,694,814
- Issue date Feb 24, 2004
- Denso Corporation
- Seiichiro Ishio
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor device and a method of producing the same
- Patent number 6,686,634
- Issue date Feb 3, 2004
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor pressure sensor having strain gauge and circuit porti...
- Patent number 6,653,702
- Issue date Nov 25, 2003
- Denso Corporation
- Seiichiro Ishio
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Capacitive physical load sensor and detection system
- Patent number 6,647,795
- Issue date Nov 18, 2003
- Denso Corporation
- Yasutoshi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive pressure sensor with multiple capacitive portions
- Patent number 6,640,643
- Issue date Nov 4, 2003
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Electrical capacitance pressure sensor having electrode with fixed...
- Patent number 6,584,852
- Issue date Jul 1, 2003
- Denso Corportation
- Yasutoshi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor strain sensor
- Patent number 6,521,966
- Issue date Feb 18, 2003
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor pressure sensor having refer...
- Patent number 6,495,389
- Issue date Dec 17, 2002
- Denso Corporation
- Seiichiro Ishio
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor acceleration sensor
- Patent number 6,448,624
- Issue date Sep 10, 2002
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Sensor failure or abnormality detecting system incorporated in a ph...
- Patent number 6,422,088
- Issue date Jul 23, 2002
- Denso Corporation
- Nobukazu Oba
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor physical quantity sensor having movable portion and f...
- Patent number 6,276,207
- Issue date Aug 21, 2001
- Denso Corporation
- Minekazu Sakai
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for producing a semiconductor
- Patent number 6,270,685
- Issue date Aug 7, 2001
- Denso Corporation
- Seiichiro Ishio
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Acceleration sensor with ring-shaped movable electrode
- Patent number 6,199,430
- Issue date Mar 13, 2001
- Denso Corporation
- Kazuhiko Kano
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for fabrication of a semiconductor sensor
- Patent number 6,143,584
- Issue date Nov 7, 2000
- Denso Corporation
- Tsuyoshi Fukada
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a semiconductor dynamic sensor using an anisot...
- Patent number 6,130,010
- Issue date Oct 10, 2000
- Denso Corporation
- Seiichiro Ishio
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor physical quantity sensor with stopper portion
- Patent number 6,065,341
- Issue date May 23, 2000
- Denso Corporation
- Seiichiro Ishio
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor strain sensor
- Patent number 5,869,876
- Issue date Feb 9, 1999
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sensor chip having conductivity film
- Publication number 20090057795
- Publication date Mar 5, 2009
- DENSO CORPORATION
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Current sensor having hall element
- Publication number 20060284611
- Publication date Dec 21, 2006
- DENSO CORPORATION
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Rotation detecting device
- Publication number 20060238190
- Publication date Oct 26, 2006
- DENSO CORPORATION
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Rotation detecting apparatus
- Publication number 20060001421
- Publication date Jan 5, 2006
- DENSO Corporation
- Kazuyoshi Sumiya
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having SOI construction
- Publication number 20050110116
- Publication date May 26, 2005
- DENSO Corporation
- Seiichiro Ishio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of producing semiconductor device
- Publication number 20040113173
- Publication date Jun 17, 2004
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having bonding pads and probe pads
- Publication number 20040032279
- Publication date Feb 19, 2004
- Seiichiro Ishio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor sensor having a diffused resistor and method for manu...
- Publication number 20040012059
- Publication date Jan 22, 2004
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Diaphragm-type semiconductor pressure sensor
- Publication number 20030217603
- Publication date Nov 27, 2003
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Pressure sensor
- Publication number 20030154796
- Publication date Aug 21, 2003
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
semiconductor device and a method of producing the same
- Publication number 20030038328
- Publication date Feb 27, 2003
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Capacitive type of pressure sensor
- Publication number 20030015040
- Publication date Jan 23, 2003
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Capacitive sensor apparatus
- Publication number 20030011378
- Publication date Jan 16, 2003
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring a characteristic of a capacitive type of sensor...
- Publication number 20030011384
- Publication date Jan 16, 2003
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Electrical capacitance presssure sensor having electrode with fixed...
- Publication number 20030005774
- Publication date Jan 9, 2003
- Yasutoshi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
Capacitive physical load sensor and detection system
- Publication number 20020178828
- Publication date Dec 5, 2002
- Yasutoshi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
Diaphragm-type semiconductor device and method for manufacturing di...
- Publication number 20020171114
- Publication date Nov 21, 2002
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Dynamic sensor having capacitance varying according to dynamic forc...
- Publication number 20020104377
- Publication date Aug 8, 2002
- Seiichiro Ishio
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Method for manufacturing semiconductor pressure sensor having refer...
- Publication number 20020028529
- Publication date Mar 7, 2002
- Seiichiro Ishio
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor pressure sensor having strain gauge and circuit porti...
- Publication number 20010052628
- Publication date Dec 20, 2001
- Seiichiro Ishio
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Seiichiro Ishio

Person

Patents Grantslast 30 patents

Rotation detecting device using magnetic sensor

Current sensor having hall element

Rotation detecting apparatus

Semiconductor device having SOI construction

Semiconductor sensor having a diffused resistor

Pressure sensor

Semiconductor device having bonding pads and probe pads

Method of producing semiconductor device

METHOD OF MEASURING A CHARACTERISTIC OF A CAPACITIVE TYPE OF SENSOR...

Diaphragm-type semiconductor device and method for manufacturing di...

Diaphragm-type semiconductor pressure sensor

Capacitive sensor apparatus

Dynamic sensor having capacitance varying according to dynamic forc...

Semiconductor device and a method of producing the same

Semiconductor pressure sensor having strain gauge and circuit porti...

Capacitive physical load sensor and detection system

Capacitive pressure sensor with multiple capacitive portions

Electrical capacitance pressure sensor having electrode with fixed...

Semiconductor strain sensor

Method for manufacturing semiconductor pressure sensor having refer...

Semiconductor acceleration sensor

Sensor failure or abnormality detecting system incorporated in a ph...

Semiconductor physical quantity sensor having movable portion and f...

Method for producing a semiconductor

Acceleration sensor with ring-shaped movable electrode

Method for fabrication of a semiconductor sensor

Method for producing a semiconductor dynamic sensor using an anisot...

Semiconductor physical quantity sensor with stopper portion

Semiconductor strain sensor

Patents Applicationslast 30 patents

Sensor chip having conductivity film

Current sensor having hall element

Rotation detecting device

Rotation detecting apparatus

Semiconductor device having SOI construction

Method of producing semiconductor device

Semiconductor device having bonding pads and probe pads

Semiconductor sensor having a diffused resistor and method for manu...

Diaphragm-type semiconductor pressure sensor

Pressure sensor

semiconductor device and a method of producing the same

Capacitive type of pressure sensor

Capacitive sensor apparatus

Method of measuring a characteristic of a capacitive type of sensor...

Electrical capacitance presssure sensor having electrode with fixed...

Capacitive physical load sensor and detection system

Diaphragm-type semiconductor device and method for manufacturing di...

Dynamic sensor having capacitance varying according to dynamic forc...

Method for manufacturing semiconductor pressure sensor having refer...

Semiconductor pressure sensor having strain gauge and circuit porti...