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Seizi Nishizawa
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Hachioji, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for observing dynamic physical property of biological tissue...
Patent number
10,718,708
Issue date
Jul 21, 2020
ADVANCED BIO-SPECTROSCOPY CO., LTD
Takashi Ushida
G01 - MEASURING TESTING
Information
Patent Grant
Optical-path-difference compensation mechanism for acquiring wave f...
Patent number
7,705,311
Issue date
Apr 27, 2010
Japan Science and Technology Agency
Seizi Nishizawa
G01 - MEASURING TESTING
Information
Patent Grant
Infrared light emitting device, infrared light detecting device, ti...
Patent number
7,615,749
Issue date
Nov 10, 2009
Japan Science and Technology Agency
Seizi Nishizawa
G01 - MEASURING TESTING
Information
Patent Grant
Optical-path-difference compensation mechanism for acquiring wave f...
Patent number
7,507,966
Issue date
Mar 24, 2009
Japan Science and Technology Agency
Seizi Nishizawa
G01 - MEASURING TESTING
Information
Patent Grant
Optical apparatus components having spectrally overlapping characte...
Patent number
5,371,596
Issue date
Dec 6, 1994
Jasco Corporation
Ryo Hattori
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for and method of evaluating multilayer thin film
Patent number
5,227,861
Issue date
Jul 13, 1993
Mitsubishi Denki Kabushiki Kaisha
Seizi Nishizawa
G01 - MEASURING TESTING
Information
Patent Grant
Michelson interferometer
Patent number
4,575,246
Issue date
Mar 11, 1986
Japan Spectroscopic Co., Ltd.
Seizi Nishizawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR OBSERVING DYNAMIC PHYSICAL PROPERTY OF BIOLOGICAL TISSUE...
Publication number
20190128803
Publication date
May 2, 2019
ADVANCED BIO-SPECTROSCOPY CO., LTD
Takashi USHIDA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR OBSERVING DYNAMIC PHYSICAL PROPERTY OF BIOLOGICAL TISSUE...
Publication number
20190128804
Publication date
May 2, 2019
ADVANCED BIO-SPECTROSCOPY CO., LTD
Takashi USHIDA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL-PATH-DIFFERENCE COMPENSATION MECHANISM FOR ACQUIRING WAVE F...
Publication number
20090152469
Publication date
Jun 18, 2009
Seizi Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
Infrared light emitting device, infrared light detecting device, ti...
Publication number
20070194253
Publication date
Aug 23, 2007
Seizi Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
Optical path difference compensation mechanism for acquiring wave f...
Publication number
20060278830
Publication date
Dec 14, 2006
Seizi Nishizawa
G01 - MEASURING TESTING