Number | Date | Country | Kind |
---|---|---|---|
1-248850 | Sep 1989 | JPX | |
2-241439 | Sep 1990 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
3319515 | Flournoy | May 1967 | |
3899253 | Overhoff | Aug 1975 | |
4555767 | Case et al. | Nov 1985 | |
4748329 | Cielo et al. | May 1988 | |
4927269 | Keens et al. | May 1990 |
Number | Date | Country |
---|---|---|
59-105508 | Jun 1984 | JPX |
61-140806 | Jun 1986 | JPX |
61-200407 | Sep 1986 | JPX |
61-235707 | Oct 1986 | JPX |
63-302307 | Dec 1988 | JPX |
8700617 | Jan 1987 | WOX |
Entry |
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IBM Technical Disclosure Bulletin, vol. 28, No. 2, Jul. 1985 "Measuring Thickness of Epitaxial Layer", pp. 493-495. |
8164 Instruments and Experimental Techniques 27 (1984) Jul.-Aug. No. 4, Part 2, New York, pp. 1036-1040. |