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Seok-Young Yoon
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Chungcheongnam-do, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for testing semiconductor chip
Patent number
7,420,382
Issue date
Sep 2, 2008
Samsung Electronics Co., Ltd.
Jun-Young Ko
G01 - MEASURING TESTING
Information
Patent Grant
POGO pin and test socket including the same
Patent number
7,245,138
Issue date
Jul 17, 2007
Samsung Electronics Co., Ltd.
Hyeck-Jin Jeong
G01 - MEASURING TESTING
Information
Patent Grant
Insert having independently movable latch mechanism for semiconduct...
Patent number
7,235,991
Issue date
Jun 26, 2007
Samsung Electronics Co., Ltd.
Jin-Woog Kim
G01 - MEASURING TESTING
Information
Patent Grant
Insert block with pusher to push semiconductor device under test
Patent number
7,151,368
Issue date
Dec 19, 2006
Samsung Electronics Co., Ltd.
Hyeck-Jin Joung
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Insert with support for semiconductor package
Publication number
20070182432
Publication date
Aug 9, 2007
SAMSUNG ELECTRONICS CO., LTD.
Hyeck-Jin Jeong
G01 - MEASURING TESTING
Information
Patent Application
Self-cleaning socket pin
Publication number
20070141877
Publication date
Jun 21, 2007
Samsung Electronics Co. Ltd.
Se-Un Lee
G01 - MEASURING TESTING
Information
Patent Application
Insert having independently movable latch mechanism for semiconduct...
Publication number
20070075702
Publication date
Apr 5, 2007
SAMSUNG ELECTRONICS CO., LTD.
Jin-Woog Kim
G01 - MEASURING TESTING
Information
Patent Application
Apparatus, customer tray, and method for testing semiconductor pack...
Publication number
20070013404
Publication date
Jan 18, 2007
SAMSUNG ELECTRONICS CO., LTD.
Seok-young Yoon
G01 - MEASURING TESTING
Information
Patent Application
POGO pin and test socket including the same
Publication number
20060145719
Publication date
Jul 6, 2006
Hyeck-Jin Jeong
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for testing semiconductor chip
Publication number
20060119375
Publication date
Jun 8, 2006
Jun-Young Ko
G01 - MEASURING TESTING
Information
Patent Application
Insert block for testing semiconductor device
Publication number
20060071656
Publication date
Apr 6, 2006
Hyeck-Jin Joung
G01 - MEASURING TESTING