Seong Min MA

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Gyeonggi-do, KR

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device with capacitors having different dielectric la...
- Patent number 11,984,446
- Issue date May 14, 2024
- SK Hynix Inc.
- Kyu Jin Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analyzing a semiconductor device
- Patent number 11,626,306
- Issue date Apr 11, 2023
- SK hynix Inc.
- Jin Hee Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for analyzing a semiconductor device
- Patent number 11,295,970
- Issue date Apr 5, 2022
- SK hynix Inc.
- Jin Hee Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology apparatus for a semiconductor pattern, metrology system i...
- Patent number 9,863,752
- Issue date Jan 9, 2018
- SK Hynix Inc.
- Yoon Shik Kang
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240282768
- Publication date Aug 22, 2024
- SK HYNIX INC.
- Kyu Jin CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240258308
- Publication date Aug 1, 2024
- SK HYNIX INC.
- Kyu Jin CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PREDICTING AN OPTIMAL PROCESS CONDITION MODEL TO IMPROVE...
- Publication number 20240176339
- Publication date May 30, 2024
- SK HYNIX INC.
- Jin Hee HAN
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20230024352
- Publication date Jan 26, 2023
- SK HYNIX INC.
- Kyu Jin CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING A SEMICONDUCTOR DEVICE
- Publication number 20220277975
- Publication date Sep 1, 2022
- SK HYNIX INC.
- Jin Hee HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ANALYZING A SEMICONDUCTOR DEVICE
- Publication number 20210028033
- Publication date Jan 28, 2021
- SK HYNIX INC.
- Jin Hee HAN
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS FOR A SEMICONDUCTOR PATTERN, METROLOGY SYSTEM I...
- Publication number 20170038194
- Publication date Feb 9, 2017
- SK HYNIX INC.
- Yoon Shik KANG
- G02 - OPTICS