Shailesh Redkar

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Padless structure design for easy identification of bridging defect...
- Patent number 6,949,765
- Issue date Sep 27, 2005
- Chartered Semiconductor Manufacturing Ltd.
- Zhigang Song
- G01 - MEASURING TESTING
Information Patent Grant
Method for etching a silicided poly using fluorine-based reactive i...
- Patent number 6,689,698
- Issue date Feb 10, 2004
- Chartered Semiconductor Manufacturing Limited
- Song Zhigang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for a plan-view transmission electron microscopy sample prep...
- Patent number 6,683,304
- Issue date Jan 27, 2004
- Chartered Semiconductor Manufacturing Limited
- Dai Jiyan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Novel fluorescent and photoemission apparatus and method for submic...
- Publication number 20060170444
- Publication date Aug 3, 2006
- Zong Min Wu
- G01 - MEASURING TESTING
Information Patent Application
Padless structure design for easy identification of bridging defect...
- Publication number 20040084671
- Publication date May 6, 2004
- Chartered Semiconductor Manufacturing Ltd.
- Zhigang Song
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR A PLAN-VIEW TRANSMISSION ELECTRON MICROSCOPY SAMPLE PREP...
- Publication number 20040004186
- Publication date Jan 8, 2004
- CHARTERED SEMICONDUCTOR MANUFACTURING LIMITED
- Dai Jiyan
- G01 - MEASURING TESTING
Information Patent Application
Method for etching a silicided poly using fluorine-based reactive i...
- Publication number 20030092276
- Publication date May 15, 2003
- CHARTERED SEMICONDUCTORS MANUFACTURED LIMITED
- Song Zhigang
- H01 - BASIC ELECTRIC ELEMENTS