Shakil Ahmad

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Inter-domain power element testing using scan
- Patent number 11,047,909
- Issue date Jun 29, 2021
- MaxLinear, Inc.
- Himanshu Kukreja
- G01 - MEASURING TESTING
Information Patent Grant
On-chip test pattern generation
- Patent number 10,120,026
- Issue date Nov 6, 2018
- Lantiq Beteiligungs-GmbH & Co. KG
- Himanshu Kukreja
- G01 - MEASURING TESTING
Information Patent Grant
Electronic package and method for testing the same
- Patent number 7,408,362
- Issue date Aug 5, 2008
- Infineon Technologies AG
- Shakil Ahmad
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Inter-Domain Power Element Testing Using Scan
- Publication number 20200132762
- Publication date Apr 30, 2020
- Intel Corporation
- Himanshu Kukreja
- G01 - MEASURING TESTING
Information Patent Application
On-Chip Test Pattern Generation
- Publication number 20170102431
- Publication date Apr 13, 2017
- Lantiq Beteiligungs-GmbH & Co., KG
- Himanshu Kukreja
- G01 - MEASURING TESTING
Information Patent Application
Electronic Package and Method for Testing the Same
- Publication number 20070285103
- Publication date Dec 13, 2007
- INFINEON TECHNOLOGIES AG
- Shakil Ahmad
- G01 - MEASURING TESTING