Shankar Radhakrishnan

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Madison, WI, US

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Patents Grantslast 30 patents

Information Patent Grant
Tunable microcantilever infrared sensor
- Patent number 7,755,049
- Issue date Jul 13, 2010
- Agiltron, Inc.
- Gregory Simelgor
- G01 - MEASURING TESTING
Information Patent Grant
Alkali metal-wax micropackets for alkali metal handling
- Patent number 7,666,485
- Issue date Feb 23, 2010
- Cornell University
- Amit Lal
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Relay-connected semiconductor transistors
- Patent number 7,495,952
- Issue date Feb 24, 2009
- Cornell Research Foundation, Inc.
- Amit Lal
- G11 - INFORMATION STORAGE
Information Patent Grant
Radioactive decay based stable time or frequency reference signal s...
- Patent number 7,476,865
- Issue date Jan 13, 2009
- Cornell Research Foundation, Inc.
- Amit Lal
- G01 - MEASURING TESTING
Information Patent Grant
Microfluidic flow sensing method and apparatus
- Patent number 6,631,648
- Issue date Oct 14, 2003
- Wisconsin Alumni Research Foundation
- Amit Lal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Tunable Microcantilever Infrared Sensor
- Publication number 20080230698
- Publication date Sep 25, 2008
- Multispectral Imaging, Inc.
- Gregory Simelgor
- G01 - MEASURING TESTING
Information Patent Application
Relay-connected semiconductor transistors
- Publication number 20070041142
- Publication date Feb 22, 2007
- Amit Lal
- G11 - INFORMATION STORAGE
Information Patent Application
Alkali metal-wax micropackets for alkali metal handling
- Publication number 20070034809
- Publication date Feb 15, 2007
- Amit Lal
- G04 - HOROLOGY
Information Patent Application
Radioactive decay based stable time or frequency reference signal s...
- Publication number 20060255281
- Publication date Nov 16, 2006
- Cornell Research Foundation
- Amita Lal
- G04 - HOROLOGY
Information Patent Application
Microfluidic flow sensing method and apparatus
- Publication number 20030074983
- Publication date Apr 24, 2003
- Amit Lal
- G01 - MEASURING TESTING