Shao-Yu Li

Person

Hsinchu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Crack detector units and the related semiconductor dies and methods
- Patent number 12,111,346
- Issue date Oct 8, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Huan-Neng Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low dropout regulator circuits, input/output device, and methods fo...
- Patent number 11,966,241
- Issue date Apr 23, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Huan-Neng Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Driving buffer with configurable slew rate for data transmission
- Patent number 11,967,958
- Issue date Apr 23, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Huan-Neng Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor and circuit structures, and related methods
- Patent number 11,646,313
- Issue date May 9, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chang-Fen Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical component testing in stacked semiconductor arrangement
- Patent number 10,886,185
- Issue date Jan 5, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Shao-Yu Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit for monitoring transient time in analog and digital systems
- Patent number 10,340,919
- Issue date Jul 2, 2019
- Taiwan Semiconductor Manufacturing Company Limited
- Shao-Yu Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
De-serialization circuit and method of operating the same
- Patent number 9,680,501
- Issue date Jun 13, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shao-Yu Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Dynamic pattern generator and method of toggling mirror cells of th...
- Patent number 9,679,747
- Issue date Jun 13, 2017
- Taiwan Semiconductor Manufacturing Company Ltd.
- Shao-Yu Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical component testing in stacked semiconductor arrangement
- Patent number 9,502,315
- Issue date Nov 22, 2016
- Taiwan Semiconductor Manufacturing Company Limited
- Shao-Yu Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit and method for delay difference measurement
- Patent number 9,366,709
- Issue date Jun 14, 2016
- TAIWAN SEMICONDUCTOR MANUFACTRURING COMPANY LTD.
- Shao-Yu Li
- G01 - MEASURING TESTING
Information Patent Grant
Frequency dependent clock apparatus and method
- Patent number 9,293,294
- Issue date Mar 22, 2016
- Taiwan Semiconductor Manufacturing Company Ltd.
- Shao-Yu Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Flip-flop circuit, frequency divider and frequency dividing method
- Patent number 8,643,408
- Issue date Feb 4, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Min-Shueh Yuan
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
CRACK DETECTOR UNITS AND THE RELATED SEMICONDUCTOR DIES AND METHODS
- Publication number 20240369613
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- HUAN-NENG CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRIVING BUFFER WITH CONFIGURABLE SLEW RATE FOR DATA TRANSMISSION
- Publication number 20240259004
- Publication date Aug 1, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Huan-Neng Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
LOW DROPOUT REGULATOR CIRCUITS, INPUT/OUTPUT DEVICE, AND METHODS FO...
- Publication number 20240255977
- Publication date Aug 1, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Huan-Neng Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CRACK DETECTOR UNITS AND THE RELATED SEMICONDUCTOR DIES AND METHODS
- Publication number 20230296659
- Publication date Sep 21, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- HUAN-NENG CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR AND CIRCUIT STRUCTURES, AND RELATED METHODS
- Publication number 20230238380
- Publication date Jul 27, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHANG-FEN HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW DROPOUT REGULATOR CIRCUITS, INPUT/OUTPUT DEVICE, AND METHODS FO...
- Publication number 20230009027
- Publication date Jan 12, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Huan-Neng Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DRIVING BUFFER WITH CONFIGURABLE SLEW RATE FOR DATA TRANSMISSION
- Publication number 20220352880
- Publication date Nov 3, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Huan-Neng Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR AND CIRCUIT STRUCTURES, AND RELATED METHODS
- Publication number 20220293597
- Publication date Sep 15, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- CHANG-FEN HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit for Monitoring Transient Time in Analog and Digital Systems
- Publication number 20190165787
- Publication date May 30, 2019
- Taiwan Semiconductor Manufacturing Company Limited
- Shao-Yu Li
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL COMPONENT TESTING IN STACKED SEMICONDUCTOR ARRANGEMENT
- Publication number 20170069552
- Publication date Mar 9, 2017
- Taiwan Semiconductor Manufacturing Company Limited
- Shao-Yu Li
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC PATTERN GENERATOR AND METHOD OF TOGGLING MIRROR CELLS OF TH...
- Publication number 20160148784
- Publication date May 26, 2016
- Taiwan Semiconductor Manufacturing company Ltd.
- SHAO-YU LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL COMPONENT TESTING IN STACKED SEMICONDUCTOR ARRANGEMENT
- Publication number 20150155245
- Publication date Jun 4, 2015
- Taiwan Semiconductor Manufacturing Company Limited
- Shao-Yu Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT AND METHOD FOR DELAY DIFFERENCE MEASUREMENT
- Publication number 20150077136
- Publication date Mar 19, 2015
- TAIWAN SEMICONDUCTOR MANUFACTRURING COMPANY LTD.
- SHAO-YU LI
- G01 - MEASURING TESTING
Information Patent Application
Electromagnetic Pointer Control Method
- Publication number 20140253523
- Publication date Sep 11, 2014
- WALTOP INTERNATIONAL CORPORATION
- Shao-Yu Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLIP-FLOP CIRCUIT, FREQUENCY DIVIDER AND FREQUENCY DIVIDING METHOD
- Publication number 20130187686
- Publication date Jul 25, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Min-Shueh YUAN
- H03 - BASIC ELECTRONIC CIRCUITRY

Person

Patents Grantslast 30 patents

Crack detector units and the related semiconductor dies and methods

Low dropout regulator circuits, input/output device, and methods fo...

Driving buffer with configurable slew rate for data transmission

Semiconductor and circuit structures, and related methods

Electrical component testing in stacked semiconductor arrangement

Circuit for monitoring transient time in analog and digital systems

De-serialization circuit and method of operating the same

Dynamic pattern generator and method of toggling mirror cells of th...

Electrical component testing in stacked semiconductor arrangement

Circuit and method for delay difference measurement

Frequency dependent clock apparatus and method

Flip-flop circuit, frequency divider and frequency dividing method

Patents Applicationslast 30 patents

CRACK DETECTOR UNITS AND THE RELATED SEMICONDUCTOR DIES AND METHODS

DRIVING BUFFER WITH CONFIGURABLE SLEW RATE FOR DATA TRANSMISSION

LOW DROPOUT REGULATOR CIRCUITS, INPUT/OUTPUT DEVICE, AND METHODS FO...

CRACK DETECTOR UNITS AND THE RELATED SEMICONDUCTOR DIES AND METHODS

SEMICONDUCTOR AND CIRCUIT STRUCTURES, AND RELATED METHODS

LOW DROPOUT REGULATOR CIRCUITS, INPUT/OUTPUT DEVICE, AND METHODS FO...

DRIVING BUFFER WITH CONFIGURABLE SLEW RATE FOR DATA TRANSMISSION

SEMICONDUCTOR AND CIRCUIT STRUCTURES, AND RELATED METHODS

Circuit for Monitoring Transient Time in Analog and Digital Systems

ELECTRICAL COMPONENT TESTING IN STACKED SEMICONDUCTOR ARRANGEMENT

DYNAMIC PATTERN GENERATOR AND METHOD OF TOGGLING MIRROR CELLS OF TH...

ELECTRICAL COMPONENT TESTING IN STACKED SEMICONDUCTOR ARRANGEMENT

CIRCUIT AND METHOD FOR DELAY DIFFERENCE MEASUREMENT

Electromagnetic Pointer Control Method

FLIP-FLOP CIRCUIT, FREQUENCY DIVIDER AND FREQUENCY DIVIDING METHOD