Shawn T. Walsh

Person

Garland, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of reducing channeling of ion implants using a sacrificial s...
- Patent number 7,927,987
- Issue date Apr 19, 2011
- Texas Instruments Incorporated
- Shawn T. Walsh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunable sidewall spacer process for CMOS integrated circuits
- Patent number 6,908,800
- Issue date Jun 21, 2005
- Texas Instruments Incorporated
- Youngmin Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shallow trench isolation planarization using self aligned isotropic...
- Patent number 6,686,283
- Issue date Feb 3, 2004
- Texas Instruments Incorporated
- Shawn T. Walsh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for trench isolation of semiconductor devices
- Patent number 6,228,741
- Issue date May 8, 2001
- Texas Instruments Incorporated
- Shawn T. Walsh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked poly/amorphous silicon gate giving low sheet resistance sil...
- Patent number 6,107,147
- Issue date Aug 22, 2000
- Texas Instruments Incorporated
- Youngmin Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating infrared detectors and the detector
- Patent number 5,095,216
- Issue date Mar 10, 1992
- Texas Instruments Incorporated
- Shawn T. Walsh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection using thin nickel fuse
- Patent number 4,801,558
- Issue date Jan 31, 1989
- Texas Instruments Incorporated
- Arturo Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection using thin nickel fuse
- Patent number 4,714,949
- Issue date Dec 22, 1987
- Texas Instruments Incorporated
- Arturo Simmons
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF REDUCING CHANNELING OF ION IMPLANTS USING A SACRIFICIAL S...
- Publication number 20080242018
- Publication date Oct 2, 2008
- Shawn T. Walsh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tunable sidewall spacer process for CMOS integrated circuits
- Publication number 20050164443
- Publication date Jul 28, 2005
- Youngmin Kim
- H01 - BASIC ELECTRIC ELEMENTS

Shawn T. Walsh

Person

Patents Grantslast 30 patents

Method of reducing channeling of ion implants using a sacrificial s...

Tunable sidewall spacer process for CMOS integrated circuits

Shallow trench isolation planarization using self aligned isotropic...

Method for trench isolation of semiconductor devices

Stacked poly/amorphous silicon gate giving low sheet resistance sil...

Method of fabricating infrared detectors and the detector

Electrostatic discharge protection using thin nickel fuse

Electrostatic discharge protection using thin nickel fuse

Patents Applicationslast 30 patents

METHOD OF REDUCING CHANNELING OF ION IMPLANTS USING A SACRIFICIAL S...

Tunable sidewall spacer process for CMOS integrated circuits