Sheng-Feng Lu

Person

Hsin-Chu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor tool having controllable ambient environment processi...
- Patent number 11,047,050
- Issue date Jun 29, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chiao-Chun Hsu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Batch-test method using a chip tray
- Patent number 7,915,903
- Issue date Mar 29, 2011
- Visera Technologies Company Limited
- Sheng-Feng Lu
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level assemble chip multi-site testing solution
- Patent number 7,595,631
- Issue date Sep 29, 2009
- Visera Technologies Company Limited
- Sheng-Feng Lu
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication of wafer-level test module for testing image sensor chips
- Patent number 7,589,033
- Issue date Sep 15, 2009
- Visera Technologies, Company Ltd.
- Sheng-Feng Lu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test socket and test board for wafer level semiconductor testing
- Patent number 7,576,551
- Issue date Aug 18, 2009
- Visera Technologies Company Limited
- Sheng-Feng Lu
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-level test module for testing image sensor chips, the related...
- Patent number 7,414,423
- Issue date Aug 19, 2008
- Visera Technologies, Company Ltd.
- Sheng-Feng Lu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TOOL HAVING CONTROLLABLE AMBIENT ENVIRONMENT PROCESSI...
- Publication number 20200131641
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Chiao-Chun Hsu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CHIP TEST METHOD
- Publication number 20090302875
- Publication date Dec 10, 2009
- Sheng-Feng Lu
- G01 - MEASURING TESTING
Information Patent Application
Test socket and test board for wafer level semiconductor testing
- Publication number 20090079461
- Publication date Mar 26, 2009
- VisEra Technologies Company Limited
- Sheng-Feng Lu
- G01 - MEASURING TESTING
Information Patent Application
Detector and detecting method
- Publication number 20090032681
- Publication date Feb 5, 2009
- VisEra Technologies Company Limited
- Sheng-Feng Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer-level test module for testing image sensor chips, the related...
- Publication number 20080280382
- Publication date Nov 13, 2008
- VISERA TECHNOLOGIES, COMPANY LTD.
- Sheng-Feng Lu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Batch-test system with a chip tray
- Publication number 20080169831
- Publication date Jul 17, 2008
- VisEra Technologies Company Limited
- Sheng-Feng Lu
- G01 - MEASURING TESTING
Information Patent Application
Wafer-level test module for testing image sensor chips, the related...
- Publication number 20080136434
- Publication date Jun 12, 2008
- VISERA TECHNOLOGIES, COMPANY LTD.
- Sheng-Feng Lu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Probe card for testing image-sensing chips
- Publication number 20080122469
- Publication date May 29, 2008
- VISERA TECHNOLOGIES, COMPANY LTD.
- Sheng-Feng Lu
- G01 - MEASURING TESTING
Information Patent Application
Packing member for packing wafer container
- Publication number 20070151896
- Publication date Jul 5, 2007
- VISERA TECHNOLOGIES, COMPANY LTD.
- Sheng-Feng Lu
- H01 - BASIC ELECTRIC ELEMENTS

Sheng-Feng Lu

Person

Patents Grantslast 30 patents

Semiconductor tool having controllable ambient environment processi...

Batch-test method using a chip tray

Wafer level assemble chip multi-site testing solution

Fabrication of wafer-level test module for testing image sensor chips

Test socket and test board for wafer level semiconductor testing

Wafer-level test module for testing image sensor chips, the related...

Patents Applicationslast 30 patents

SEMICONDUCTOR TOOL HAVING CONTROLLABLE AMBIENT ENVIRONMENT PROCESSI...

CHIP TEST METHOD

Test socket and test board for wafer level semiconductor testing

Detector and detecting method

Wafer-level test module for testing image sensor chips, the related...

Batch-test system with a chip tray

Wafer-level test module for testing image sensor chips, the related...

Probe card for testing image-sensing chips

Packing member for packing wafer container