Shigeaki Hijikata

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Ome, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting pattern and inspecting instrument
- Patent number 8,558,173
- Issue date Oct 15, 2013
- Hitachi, Ltd.
- Mari Nozoe
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and defect inspection system
- Patent number 8,358,406
- Issue date Jan 22, 2013
- Hitachi High-Technologies Corporation
- Masami Ikota
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting pattern and inspecting instrument
- Patent number 7,112,791
- Issue date Sep 26, 2006
- Hitachi Tokyo Electronics Co. Ltd.
- Mari Nozoe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting pattern and inspecting instrument
- Patent number 6,777,677
- Issue date Aug 17, 2004
- Hitachi, Ltd.
- Mari Nozoe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting pattern and inspecting instrument
- Patent number 6,583,414
- Issue date Jun 24, 2003
- Hitachi, Ltd.
- Mari Nozoe
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM
- Publication number 20090180109
- Publication date Jul 16, 2009
- Hitachi High-Technologies Corporation
- Masami Ikota
- G01 - MEASURING TESTING
Information Patent Application
DATA PROCESSING APPARATUS AND DATA PROCESSING METHOD
- Publication number 20080298669
- Publication date Dec 4, 2008
- Hitachi High-Technologies Corporation
- Tomohiro Funakoshi
- G01 - MEASURING TESTING
Information Patent Application
Method of inspecting pattern and inspecting instrument
- Publication number 20070023658
- Publication date Feb 1, 2007
- Mari Nozoe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of inspecting pattern and inspecting instrument
- Publication number 20050006583
- Publication date Jan 13, 2005
- Mari Nozoe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of inspecting pattern and inspecting instrument
- Publication number 20030213909
- Publication date Nov 20, 2003
- Mari Nozoe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of inspecting pattern and inspecting instrument
- Publication number 20010017878
- Publication date Aug 30, 2001
- Mari Nozoe
- G01 - MEASURING TESTING