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Mito, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Detector having self-calibration function
Patent number
5,574,211
Issue date
Nov 12, 1996
Hitachi, Ltd.
Satoshi Shimada
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance type accelerometer
Patent number
5,559,290
Issue date
Sep 24, 1996
Hitachi, Ltd.
Seiko Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Detector having self-calibration function
Patent number
5,429,736
Issue date
Jul 4, 1995
Hitachi, Ltd.
Satoshi Shimada
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor acceleration sensor and vehicle control system using...
Patent number
5,417,312
Issue date
May 23, 1995
Hitachi, Ltd.
Shigeki Tsuchitani
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance type accelerometer
Patent number
5,392,651
Issue date
Feb 28, 1995
Hitachi, Ltd.
Seiko Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Detector having self-calibration function
Patent number
5,391,283
Issue date
Feb 21, 1995
Hitachi, Ltd.
Satoshi Shimada
G01 - MEASURING TESTING
Information
Patent Grant
Electrostatic type micro transducer and control system using the same
Patent number
5,367,429
Issue date
Nov 22, 1994
Hitachi, Ltd.
Shigeki Tsuchitani
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Sensor
Patent number
5,365,768
Issue date
Nov 22, 1994
Hitachi, Ltd.
Seiko Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance type accelerometer for air bag system
Patent number
5,350,189
Issue date
Sep 27, 1994
Hitachi, Ltd.
Shigeki Tsuchitani
G01 - MEASURING TESTING
Information
Patent Grant
Capacitive type semiconductor accelerometer
Patent number
5,243,861
Issue date
Sep 14, 1993
Hitachi, Ltd.
Benjamin Kloeck
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Capacitive acceleration detector having reduced mass portion
Patent number
5,228,341
Issue date
Jul 20, 1993
Hitachi, Ltd.
Shigeki Tsuchitani
G01 - MEASURING TESTING
Information
Patent Grant
Detector having self-calibration function
Patent number
5,174,884
Issue date
Dec 29, 1992
Hitachi, Ltd.
Satoshi Shimada
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer with pulse width modulation
Patent number
5,095,750
Issue date
Mar 17, 1992
Hitachi, Ltd.
Seikou Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance type accelerometer
Patent number
5,095,752
Issue date
Mar 17, 1992
Hitachi, Ltd.
Seiko Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Spatial filter type speed measuring apparatus
Patent number
4,921,345
Issue date
May 1, 1990
Hitachi, Ltd.
Shigeki Tsuchitani
G01 - MEASURING TESTING
Information
Patent Grant
Optical functional device of an optical waveguide type
Patent number
4,896,930
Issue date
Jan 30, 1990
Hitachi, Ltd.
Shigeki Tsuchitani
G02 - OPTICS
Information
Patent Grant
Optical interconnections for integrated circuits
Patent number
4,835,595
Issue date
May 30, 1989
Hitachi, Ltd.
Shigeru Oho
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Humidity-sensitive element
Patent number
4,642,601
Issue date
Feb 10, 1987
Hitachi, Ltd.
Tooru Sugawara
G01 - MEASURING TESTING
Information
Patent Grant
Humidity sensor with improved protective layering
Patent number
4,473,813
Issue date
Sep 25, 1984
Hitachi, Ltd.
Noriyuki Kinjo
G01 - MEASURING TESTING