Shigeru Sugamori

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Event based IC test system
- Patent number 7,089,135
- Issue date Aug 8, 2006
- Advantest Corp.
- Rochit Rajsuman
- G01 - MEASURING TESTING
Information Patent Grant
Event based semiconductor test system
- Patent number 6,678,643
- Issue date Jan 13, 2004
- Advantest Corp.
- James Alan Turnquist
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for successively generating an event to establ...
- Patent number 6,668,331
- Issue date Dec 23, 2003
- Advantest Corp.
- Glen A. Gomes
- G01 - MEASURING TESTING
Information Patent Grant
Modular architecture for memory testing on event based test system
- Patent number 6,651,204
- Issue date Nov 18, 2003
- Advantest Corp.
- Rochit Rajsuman
- G01 - MEASURING TESTING
Information Patent Grant
Application specific event based semiconductor memory test system
- Patent number 6,631,340
- Issue date Oct 7, 2003
- Advantest Corp.
- Shigeru Sugamori
- G11 - INFORMATION STORAGE
Information Patent Grant
Module based flexible semiconductor test system
- Patent number 6,629,282
- Issue date Sep 30, 2003
- Advantest Corp.
- Shigeru Sugamori
- G01 - MEASURING TESTING
Information Patent Grant
Data failure memory compaction for semiconductor test system
- Patent number 6,578,169
- Issue date Jun 10, 2003
- Advantest Corp.
- Anthony Le
- G11 - INFORMATION STORAGE
Information Patent Grant
Event based test system storing pin calibration data in non-volatil...
- Patent number 6,567,941
- Issue date May 20, 2003
- Advantest Corp.
- James Alan Turnquist
- G11 - INFORMATION STORAGE
Information Patent Grant
Power source current measurement unit for semiconductor test system
- Patent number 6,545,460
- Issue date Apr 8, 2003
- Advantest Corp.
- Shigeru Sugamori
- G01 - MEASURING TESTING
Information Patent Grant
Event tester architecture for mixed signal testing
- Patent number 6,536,006
- Issue date Mar 18, 2003
- Advantest Corp.
- Shigeru Sugamori
- G01 - MEASURING TESTING
Information Patent Grant
Event based semiconductor test system
- Patent number 6,532,561
- Issue date Mar 11, 2003
- Advantest Corp.
- James Alan Turnquist
- G01 - MEASURING TESTING
Information Patent Grant
Power source current measurement unit for semiconductor test system
- Patent number 6,445,208
- Issue date Sep 3, 2002
- Advantest Corp.
- Shigeru Sugamori
- G01 - MEASURING TESTING
Information Patent Grant
Multiple end of test signal for event based test system
- Patent number 6,404,218
- Issue date Jun 11, 2002
- Advantest Corp.
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Glitch detection for semiconductor test system
- Patent number 6,377,065
- Issue date Apr 23, 2002
- Advantest Corp.
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Application specific event based semiconductor test system
- Patent number 6,331,770
- Issue date Dec 18, 2001
- Advantest Corp.
- Shigeru Sugamori
- G01 - MEASURING TESTING
Information Patent Grant
Application specific event based semiconductor memory test system
- Patent number 6,314,034
- Issue date Nov 6, 2001
- Advantest Corp.
- Shigeru Sugamori
- G11 - INFORMATION STORAGE
Information Patent Grant
Maintenance free test system
- Patent number 6,185,708
- Issue date Feb 6, 2001
- Advantest Corp.
- Shigeru Sugamori
- G01 - MEASURING TESTING
Information Patent Grant
Timing signal generation circuit for semiconductor test system
- Patent number 6,172,544
- Issue date Jan 9, 2001
- Advantest Corp.
- Shigeru Sugamori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Event based IC test system
- Publication number 20030217345
- Publication date Nov 20, 2003
- Rochit Rajsuman
- G01 - MEASURING TESTING
Information Patent Application
Application specific event based semiconductor memory test system
- Publication number 20030074153
- Publication date Apr 17, 2003
- Shigeru Sugamori
- G11 - INFORMATION STORAGE
Information Patent Application
Power source current measurement unit for semiconductor test system
- Publication number 20020070726
- Publication date Jun 13, 2002
- Advantest Corp.
- Shigeru Sugamori
- G01 - MEASURING TESTING

Shigeru Sugamori

Person

Patents Grantslast 30 patents

Event based IC test system

Event based semiconductor test system

Apparatus and method for successively generating an event to establ...

Modular architecture for memory testing on event based test system

Application specific event based semiconductor memory test system

Module based flexible semiconductor test system

Data failure memory compaction for semiconductor test system

Event based test system storing pin calibration data in non-volatil...

Power source current measurement unit for semiconductor test system

Event tester architecture for mixed signal testing

Event based semiconductor test system

Power source current measurement unit for semiconductor test system

Multiple end of test signal for event based test system

Glitch detection for semiconductor test system

Application specific event based semiconductor test system

Application specific event based semiconductor memory test system

Maintenance free test system

Timing signal generation circuit for semiconductor test system

Patents Applicationslast 30 patents

Event based IC test system

Application specific event based semiconductor memory test system

Power source current measurement unit for semiconductor test system