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SHIGERU TOHYAMA
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TOKYO, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Solid-state image sensing device with detecting units having a micr...
Patent number
9,287,301
Issue date
Mar 15, 2016
NEC Corporation
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Grant
Thermal-type infrared solid-state image sensing device and method o...
Patent number
8,796,630
Issue date
Aug 5, 2014
NEC Corporation
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Grant
Thermal-type infrared solid-state imaging device and manufacturing...
Patent number
8,101,914
Issue date
Jan 24, 2012
NEC Corporation
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Grant
Infrared detecting apparatus and infrared imaging apparatus using t...
Patent number
7,541,583
Issue date
Jun 2, 2009
NEC Corporation
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Grant
Thermal-type infra-red ray solid-state image sensor and method of f...
Patent number
7,276,698
Issue date
Oct 2, 2007
NEC Corporation
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Grant
Bolometer-type infrared solid-state image sensor
Patent number
7,232,998
Issue date
Jun 19, 2007
NEC Corporation
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Grant
Charge coupled device having charge accumulating layer free from to...
Patent number
6,369,414
Issue date
Apr 9, 2002
NEC Corporation
Yukiya Kawakami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Solid-state image sensor and method of fabricating the same
Patent number
6,018,169
Issue date
Jan 25, 2000
NEC Corporation
Shigeru Tohyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Backside-illuminated charge-coupled device imager and method for ma...
Patent number
5,907,767
Issue date
May 25, 1999
NEC Corporation
Shigeru Tohyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for fabricating charge coupled device (CCD) as semiconductor...
Patent number
5,858,811
Issue date
Jan 12, 1999
NEC Corporation
Shigeru Tohyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thermal type infrared radiation solid state image pick-up device
Patent number
5,852,321
Issue date
Dec 22, 1998
NEC Corporation
Shigeru Tohyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Solid state image device having a transparent Schottky electrode
Patent number
5,710,447
Issue date
Jan 20, 1998
NEC Corporation
Shigeru Tohyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Protection circuit for semiconductor device
Patent number
5,684,323
Issue date
Nov 4, 1997
NEC Corporation
Shigeru Tohyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Back-illuminated type photoelectric conversion device
Patent number
5,598,016
Issue date
Jan 28, 1997
NEC Corporation
Akihito Tanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of driving photoelectric conversion device
Patent number
5,565,676
Issue date
Oct 15, 1996
NEC Corporation
Akihito Tanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Solid state imaging device having a plurality of signal lines for s...
Patent number
5,537,146
Issue date
Jul 16, 1996
NEC Corporation
Shigeru Tohyama
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Optoelectric transducer
Patent number
4,875,084
Issue date
Oct 17, 1989
NEC Corporation
Shigeru Tohyama
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SOLID-STATE IMAGE SENSING DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20130248686
Publication date
Sep 26, 2013
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Application
THERMAL-TYPE INFRARED SOLID-STATE IMAGE SENSING DEVICE AND METHOD O...
Publication number
20120241626
Publication date
Sep 27, 2012
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Application
THERMAL-TYPE INFRARED SOLID-STATE IMAGING ELEMENT
Publication number
20110198720
Publication date
Aug 18, 2011
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Application
THERMAL-TYPE INFRARED SOLID-STATE IMAGING DEVICE AND MANUFACTURING...
Publication number
20090242768
Publication date
Oct 1, 2009
Shigeru TOHYAMA
G01 - MEASURING TESTING
Information
Patent Application
Infrared detecting apparatus and infrared imaging apparatus using t...
Publication number
20070215807
Publication date
Sep 20, 2007
NEC Corporation
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Application
Thermal-type infra-red ray solid-state image sensor and method of f...
Publication number
20050218326
Publication date
Oct 6, 2005
NEC Corporation
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Application
Thermal-type infra-red ray solid-state image sensor and method of f...
Publication number
20050116169
Publication date
Jun 2, 2005
NEC Corporation
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Application
Bolometer-type infrared solid-state image sensor
Publication number
20030209668
Publication date
Nov 13, 2003
NEC Corporation
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Application
CHARGE COUPLED DEVICE HAVING CHARGE ACCUMULATING LAYER FREE FROM TO...
Publication number
20010035538
Publication date
Nov 1, 2001
YUKIYA KAWAKAMI
H01 - BASIC ELECTRIC ELEMENTS