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Shih-Ching LEE

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  • HSINCHU COUNTY, TW
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Patents Grantslast 30 patents

  • Information Patent Grant

    Active stylus having physical writing function
    • Patent number 12,223,127
    • Issue date Feb 11, 2025
    • Renaisser Technology Co., Ltd. Corp.
    • Shih-Yen Lee
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Inertial sensor
    • Patent number 11,933,809
    • Issue date Mar 19, 2024
    • Sensortek Technology Corp.
    • Shih-Wei Lee
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Gyroscope structure
    • Patent number 11,614,327
    • Issue date Mar 28, 2023
    • Sensortek Technology Corp.
    • Shih-Hsiung Tseng
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Microelectromechanical systems gyroscope
    • Patent number 11,193,770
    • Issue date Dec 7, 2021
    • Sensortek Technology Corp.
    • Shih-Wei Lee
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Three-axis Gyroscope
    • Publication number 20240425355
    • Publication date Dec 26, 2024
    • SensorTek technology Corp.
    • Shih-Hsiung TSENG
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    Inertial Sensor
    • Publication number 20240425357
    • Publication date Dec 26, 2024
    • SensorTek technology Corp.
    • Shih-Yuan LIU
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    ACTIVE STYLUS HAVING PHYSICAL WRITING FUNCTION
    • Publication number 20240094834
    • Publication date Mar 21, 2024
    • RENAISSER TECHNOLOGY CO., LTD.
    • Shih-Yen LEE
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Anchor Structure
    • Publication number 20240017987
    • Publication date Jan 18, 2024
    • SensorTek technology Corp.
    • Shih-Wei Lee
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    INERTIAL SENSOR
    • Publication number 20230055638
    • Publication date Feb 23, 2023
    • SENSORTEK TECHNOLOGY CORP.
    • SHIH-WEI LEE
    • G01 - MEASURING TESTING
  • Information Patent Application

    GYROSCOPE STRUCTURE
    • Publication number 20220026210
    • Publication date Jan 27, 2022
    • SENSORTEK TECHNOLOGY CORP.
    • SHIH-HSIUNG TSENG
    • G01 - MEASURING TESTING
  • Information Patent Application

    MICROELECTROMECHANICAL SYSTEMS GYROSCOPE
    • Publication number 20210088335
    • Publication date Mar 25, 2021
    • SENSORTEK TECHNOLOGY CORP.
    • SHIH-WEI LEE
    • G01 - MEASURING TESTING
  • Information Patent Application

    Light Guide Module And Light Guide Structure Thereof
    • Publication number 20170254940
    • Publication date Sep 7, 2017
    • GEMTEK TECHNOLOGY CO., LTD.
    • Shih-Ching LEE
    • G02 - OPTICS