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AIR CURTAIN FOR DEFECT REDUCTION
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Wei-Chih LIAO
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H01 - BASIC ELECTRIC ELEMENTS
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ELECTRONIC DEVICE
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Publication date Sep 19, 2024
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WISTRON NEWEB CORPORATION
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HSIEH-CHIH LIN
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H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR PACKAGE AND METHOD
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Publication number 20240250036
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Publication date Jul 25, 2024
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TAIWAN SEMICODUCTOR MANUFACTURING CO., LTD.
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Shih-Hao Tseng
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H01 - BASIC ELECTRIC ELEMENTS
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INERTIAL SENSOR
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Publication number 20230055638
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Publication date Feb 23, 2023
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SENSORTEK TECHNOLOGY CORP.
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SHIH-WEI LEE
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G01 - MEASURING TESTING
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AIR CURTAIN FOR DEFECT REDUCTION
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Publication number 20220344190
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Publication date Oct 27, 2022
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Taiwan Semiconductor Manufacturing Co., Ltd.
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Wei-Chih Liao
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H01 - BASIC ELECTRIC ELEMENTS
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GYROSCOPE STRUCTURE
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Publication number 20220026210
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Publication date Jan 27, 2022
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SENSORTEK TECHNOLOGY CORP.
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SHIH-HSIUNG TSENG
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G01 - MEASURING TESTING
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ELECTRONIC DEVICE
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Publication number 20210351509
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Publication date Nov 11, 2021
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WISTRON NEWEB CORPORATION
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HSIEH-CHIH LIN
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H01 - BASIC ELECTRIC ELEMENTS
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Semiconductor Package and Method
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Publication number 20210296245
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Publication date Sep 23, 2021
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Taiwan Semiconductor Manufacturing Co., Ltd.
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Shih-Hao Tseng
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H01 - BASIC ELECTRIC ELEMENTS
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BATTERY CHARGING METHOD
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Publication number 20210036531
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Publication date Feb 4, 2021
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PEGATRON CORPORATION
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Shih-Feng Tseng
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H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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