Holon, IL
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Patent Grant
Applied Materials, Inc.
Avner Karpol
G01 - MEASURING TESTING
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Patent Grant
Applied Materials, Inc.
Avner Karpol
G01 - MEASURING TESTING
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Patent Grant
Applied Materials, Inc.
Avner Karpol
G01 - MEASURING TESTING
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Patent Grant
Applied Materials, Inc.
Avner Karpol
G01 - MEASURING TESTING
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Patent Grant
Applied Materials, Inc.
Avner Karpol
G01 - MEASURING TESTING
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Patent Grant
Applied Materials, Inc.
Avner Karpol
G02 - OPTICS
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Patent Grant
Applied Materials, Inc.
Avner Karpol
G02 - OPTICS
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Patent Application
Applied Materials, Inc.
Avner Karpol
G02 - OPTICS
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Patent Application
Applied Materials, Inc.
Avner Karpol
G02 - OPTICS
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Patent Application
Applied Materials, Inc.
Avner Karpol
G02 - OPTICS
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Patent Application
APPLIED MATERIALS, INC.
Avner Karpol
G01 - MEASURING TESTING
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Patent Application
APPLIED MATERIALS, INC.
Avner Karpol
G01 - MEASURING TESTING
Information
Patent Application
APPLIED MATERIALS, INC.
Avner Karpol
G01 - MEASURING TESTING
