Shing-Ren Sheu

Person

Taoyuan City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Device under test array for identifying defects
- Patent number 7,859,285
- Issue date Dec 28, 2010
- United Microelectronics Corp.
- Shing-Ren Sheu
- G01 - MEASURING TESTING
Information Patent Grant
Parasitic capacitance-preventing dummy solder bump structure and me...
- Patent number 7,026,234
- Issue date Apr 11, 2006
- United Microelectronics Corp.
- Jui-Meng Jao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bonding pad structure of semiconductor device having improved bonda...
- Patent number 6,455,943
- Issue date Sep 24, 2002
- United Microelectronics Corp.
- Shing-Ren Sheu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable work function transistor high density mask ROM
- Patent number 6,417,548
- Issue date Jul 9, 2002
- United Microelectronics Corp.
- Shing-Ren Sheu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor read-only memory device and method of fabricating the...
- Patent number 6,380,587
- Issue date Apr 30, 2002
- United Microelectronics Corp.
- Shing-Ren Sheu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor read-only memory device and method of fabricating the...
- Patent number 6,350,654
- Issue date Feb 26, 2002
- United Microelectronics Corp.
- Shing-Ren Sheu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing multiple metallic layered embedded ROM
- Patent number 6,146,950
- Issue date Nov 14, 2000
- United Microelectronics Corp.
- Shing-Ren Sheu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Buried contact method to release plasma-included charging damage on...
- Patent number 6,093,626
- Issue date Jul 25, 2000
- United Microelectronics Corp.
- Kuan-Cheng Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Short turn around time mask ROM process
- Patent number 6,054,353
- Issue date Apr 25, 2000
- United Microelectronics Corporation
- Shing-Ren Sheu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal oxide semiconductor device for an electro-static discharge ci...
- Patent number 5,998,832
- Issue date Dec 7, 1999
- United Microelectronics, Corp.
- Shing-Ren Sheu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable work function transistor high density mask ROM
- Patent number 5,942,786
- Issue date Aug 24, 1999
- United Microelectronics Corp.
- Shing-Ren Sheu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Buried contact method to release plasma-induced charging damage on...
- Patent number 5,691,234
- Issue date Nov 25, 1997
- United Microelectronics Corporation
- Kuan-Cheng Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post-titanium nitride mask ROM programming method and device manufa...
- Patent number 5,654,576
- Issue date Aug 5, 1997
- United Microelectronics Corporation
- Chen-Chiu Hsue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CVD oxide coding method for ultra-high density mask read-only-memor...
- Patent number 5,597,753
- Issue date Jan 28, 1997
- United Microelectronics Corporation
- Shing-Ren Sheu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for fabricating a high-voltage MOSFET
- Patent number 5,589,411
- Issue date Dec 31, 1996
- United Microelectronics Corporation
- Sheng-Hsing Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked CVD oxide architecture multi-state memory cell for mask rea...
- Patent number 5,576,573
- Issue date Nov 19, 1996
- United Microelectronics Corporation
- Kuan-Cheng Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal oxide semiconductor device integral with an electro-static di...
- Patent number 5,571,737
- Issue date Nov 5, 1996
- United Microelectronics Corporation
- Shing-Ren Sheu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post metal mask ROM with thin glass dielectric layer formed over wo...
- Patent number 5,567,970
- Issue date Oct 22, 1996
- United Microelectronics Corporation
- Shing-Ren Sheu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post-titanium nitride mask ROM programming method
- Patent number 5,488,009
- Issue date Jan 30, 1996
- United Microelectronics Corporation
- Chen-Chiu Hsue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of implanting during manufacture of ROM device
- Patent number 5,429,975
- Issue date Jul 4, 1995
- United Microelectronics Corporation
- Shing-Ren Sheu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect transistor with recessed buried source and drain regions
- Patent number 5,382,534
- Issue date Jan 17, 1995
- United Microelectronics Corporation
- Shing-Ren Sheu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor structure
- Publication number 20250219031
- Publication date Jul 3, 2025
- UNITED MICROELECTRONICS CORP.
- Yi-Feng Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON PHOTONICS STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20250028116
- Publication date Jan 23, 2025
- United Microelectronics Corp.
- Meng Ting Chiang
- G02 - OPTICS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR FABRICATING THE SAME
- Publication number 20240347503
- Publication date Oct 17, 2024
- United Microelectronics Corp.
- Shing-Ren SHEU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST SYSTEM FOR IDENTIFYING DEFECTS AND METHOD OF OPERATING THE SAME
- Publication number 20090322360
- Publication date Dec 31, 2009
- Shing-Ren Sheu
- G01 - MEASURING TESTING
Information Patent Application
ANTI-FUSE
- Publication number 20090026576
- Publication date Jan 29, 2009
- United Microelectronics Corp.
- Kuang-Yeh Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING ANTI-FUSE AND METHOD OF PROGRAMMING ANTI-FUSE
- Publication number 20090029541
- Publication date Jan 29, 2009
- United Microelectronics Corp.
- Kuang-Yeh Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTI-FUSE WHICH WILL NOT GENERATE A NON-LINEAR CURRENT AFTER BEING...
- Publication number 20080211060
- Publication date Sep 4, 2008
- Kuang-Yeh Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARASITIC CAPACITANCE-PREVENTING DUMMY SOLDER BUMP STRUCTURE AND ME...
- Publication number 20040266160
- Publication date Dec 30, 2004
- Jui-Meng Jao
- H01 - BASIC ELECTRIC ELEMENTS

Shing-Ren Sheu

Person

Patents Grantslast 30 patents

Device under test array for identifying defects

Parasitic capacitance-preventing dummy solder bump structure and me...

Bonding pad structure of semiconductor device having improved bonda...

Variable work function transistor high density mask ROM

Semiconductor read-only memory device and method of fabricating the...

Semiconductor read-only memory device and method of fabricating the...

Method of manufacturing multiple metallic layered embedded ROM

Buried contact method to release plasma-included charging damage on...

Short turn around time mask ROM process

Metal oxide semiconductor device for an electro-static discharge ci...

Variable work function transistor high density mask ROM

Buried contact method to release plasma-induced charging damage on...

Post-titanium nitride mask ROM programming method and device manufa...

CVD oxide coding method for ultra-high density mask read-only-memor...

Process for fabricating a high-voltage MOSFET

Stacked CVD oxide architecture multi-state memory cell for mask rea...

Metal oxide semiconductor device integral with an electro-static di...

Post metal mask ROM with thin glass dielectric layer formed over wo...

Post-titanium nitride mask ROM programming method

Method of implanting during manufacture of ROM device

Field effect transistor with recessed buried source and drain regions

Patents Applicationslast 30 patents

Semiconductor structure

SILICON PHOTONICS STRUCTURE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR STRUCTURE AND METHOD FOR FABRICATING THE SAME

TEST SYSTEM FOR IDENTIFYING DEFECTS AND METHOD OF OPERATING THE SAME

ANTI-FUSE

METHOD OF FABRICATING ANTI-FUSE AND METHOD OF PROGRAMMING ANTI-FUSE

ANTI-FUSE WHICH WILL NOT GENERATE A NON-LINEAR CURRENT AFTER BEING...

PARASITIC CAPACITANCE-PREVENTING DUMMY SOLDER BUMP STRUCTURE AND ME...