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Shinichiro Yagi
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Gunma, JP
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Patents Grants
last 30 patents
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Patent Grant
Method for manufacturing a bonded SOI wafer
Patent number
10,460,983
Issue date
Oct 29, 2019
SHIN-ETSU HANDOTAI CO.,LTD.
Taishi Wakabayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing SOI wafer and SOI wafer
Patent number
7,892,948
Issue date
Feb 22, 2011
Shin-Etsu Handotai Co., Ltd.
Shinichiro Yagi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection device for crystal defect of silicon wafer and method fo...
Patent number
6,753,955
Issue date
Jun 22, 2004
Shin-Etsu Handotai Co., Ltd.
Shinichiro Yagi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR MANUFACTURING A BONDED SOI WAFER
Publication number
20170040210
Publication date
Feb 9, 2017
Shin-Etsu Handotai Co., Ltd.
Taishi WAKABAYASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method For Manufacturing Soi Wafer and Soi Wafer
Publication number
20090042364
Publication date
Feb 12, 2009
Shin-Etsu Handotai Co., Ltd.
Shinichiro Yagi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Vapor phase growth apparatus and method of fabricating epitaxial wafer
Publication number
20070122323
Publication date
May 31, 2007
Shin-Etsu Handotai Co., Ltd.
Toru Yamada
C30 - CRYSTAL GROWTH
Information
Patent Application
Inspection device for crystal defect of silicon wafer and method fo...
Publication number
20020167661
Publication date
Nov 14, 2002
Shinichiro Yagi
C30 - CRYSTAL GROWTH