Shinichirou Yanaka

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inspecting positioning machine by laser tr...
- Patent number 10,557,941
- Issue date Feb 11, 2020
- Mitutoyo Corporation
- Shinichirou Yanaka
- G01 - MEASURING TESTING
Information Patent Grant
Laser tracking interferometer
- Patent number 7,388,674
- Issue date Jun 17, 2008
- Mitutoyo Corporation
- Shinichirou Yanaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR INSPECTING POSITIONING MACHINE BY LASER TR...
- Publication number 20180038960
- Publication date Feb 8, 2018
- MITUTOYO CORPORATION
- Shinichirou YANAKA
- G01 - MEASURING TESTING
Information Patent Application
LASER TRACKING INTERFEROMETER
- Publication number 20070024861
- Publication date Feb 1, 2007
- Mitutoyo Corporation
- Shinichirou Yanaka
- G01 - MEASURING TESTING