Shinji Kuniyoshi

Person

Suginami, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe and electrical connecting apparatus using it
- Patent number 7,924,038
- Issue date Apr 12, 2011
- Kabushiki Kaisha Nihon Micronics
- Shinji Kuniyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing an electrical test probe
- Patent number 7,736,690
- Issue date Jun 15, 2010
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe for electrical test and electrical connecting apparatus using it
- Patent number 7,679,389
- Issue date Mar 16, 2010
- Kabushiki Kaisha Nihon Micronics
- Shinji Kuniyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly, method of producing it and electrical connecting ap...
- Patent number 7,667,472
- Issue date Feb 23, 2010
- Kabushiki Kaisha Nihon Micronics
- Kiyotoshi Miura
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test probe
- Patent number 7,629,807
- Issue date Dec 8, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test probe and electrical test probe assembly
- Patent number 7,586,321
- Issue date Sep 8, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe board mounting apparatus
- Patent number 7,586,316
- Issue date Sep 8, 2009
- Kabushiki Kaisha Nihon Micronics
- Shinji Kuniyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Probe for electrical test and probe assembly
- Patent number 7,557,593
- Issue date Jul 7, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a probe
- Patent number 7,523,539
- Issue date Apr 28, 2009
- Kabushiki Kaisha Nihon Micronics
- Takayuki Hayashizaki
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication method for semiconductor integrated circuit device
- Patent number 7,375,037
- Issue date May 20, 2008
- Renesas Technology Corp.
- Kazuo Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication method for semiconductor integrated circuit devices and...
- Patent number 6,633,072
- Issue date Oct 14, 2003
- Hitachi, Ltd.
- Kazuo Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication method for semiconductor integrated circuit devices and...
- Patent number 6,479,392
- Issue date Nov 12, 2002
- Hitachi, Ltd.
- Kazuo Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device fabrication method and its...
- Patent number 5,497,331
- Issue date Mar 5, 1996
- Hitachi, Ltd.
- Nobuyuki Iriki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask for exposing wafer with radiation and its exposing method
- Patent number 5,115,456
- Issue date May 19, 1992
- Hitachi, Ltd.
- Takeshi Kimura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern transistor mask and method of using the same
- Patent number 4,964,146
- Issue date Oct 16, 1990
- Hitachi, Ltd.
- Shinji Kuniyoshi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for correcting defects of X-ray mask
- Patent number 4,933,565
- Issue date Jun 12, 1990
- Hitachi, Ltd.
- Hiroshi Yamaguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of correcting defect in circuit pattern
- Patent number 4,925,755
- Issue date May 15, 1990
- Hitachi, Ltd.
- Hiroshi Yamaguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Crystal monochromator
- Patent number 4,737,973
- Issue date Apr 12, 1988
- Hitachi, Ltd.
- Taro Ogawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Mask for X-ray lithography and process for producing the same
- Patent number 4,719,161
- Issue date Jan 12, 1988
- Hitachi, Ltd.
- Takeshi Kimura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical exposer
- Patent number 4,690,529
- Issue date Sep 1, 1987
- Hitachi, Ltd.
- Shuji Sugiyama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern detector
- Patent number 4,614,432
- Issue date Sep 30, 1986
- Hitachi, Ltd.
- Shinji Kuniyoshi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern detector
- Patent number 4,597,669
- Issue date Jul 1, 1986
- Hitachi, Ltd.
- Tsuneo Terasawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern generator
- Patent number 4,504,726
- Issue date Mar 12, 1985
- Hitachi, Ltd.
- Sumio Hosaka
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Pattern forming apparatus
- Patent number 4,480,910
- Issue date Nov 6, 1984
- Hitachi, Ltd.
- Akihiro Takanashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automatic focusing apparatus
- Patent number 4,477,183
- Issue date Oct 16, 1984
- Hitachi, Ltd.
- Yoshio Kawamura
- G02 - OPTICS
Information Patent Grant
Pattern detecting apparatus
- Patent number 4,441,206
- Issue date Apr 3, 1984
- Hitachi, Ltd.
- Shinji Kuniyoshi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reduction projection aligner system
- Patent number 4,380,395
- Issue date Apr 19, 1983
- Hitachi, Ltd.
- Shinji Kuniyoshi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
PROBE AND ELECTRICAL CONNECTING APPARATUS USING IT
- Publication number 20100219854
- Publication date Sep 2, 2010
- KABUSHIKI KAISHA NIHON MICRONICS
- Shinji Kuniyoshi
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TEST PROBE
- Publication number 20090058441
- Publication date Mar 5, 2009
- KABUSHIKI KAISHA NIHON MICRONICS
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY, METHOD OF PRODUCING IT AND ELECTRICAL CONNECTING AP...
- Publication number 20090058440
- Publication date Mar 5, 2009
- Kabushiki Kaisha Nihon Micronics
- Kiyotoshi Miura
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR ELECTRICAL TEST AND ELECTRICAL CONNECTING APPARATUS USING IT
- Publication number 20090051382
- Publication date Feb 26, 2009
- Kabushiki Kaisha Nihon Micronics
- Shinji KUNIYOSHI
- G01 - MEASURING TESTING
Information Patent Application
Electrical Connecting Apparatus
- Publication number 20080315905
- Publication date Dec 25, 2008
- Kabushiki Kaisha Nihon Mocronics
- Shinji Kuniyoshi
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TEST PROBE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20080186038
- Publication date Aug 7, 2008
- Kabushiki Kaisha Nihon Micronics
- Hideki HIRAKAWA
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20080143368
- Publication date Jun 19, 2008
- Kabushiki Kaisha Nihon Micronics
- Takayuki HAYASHIZAKI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TEST PROBE AND ELECTRICAL TEST PROBE ASSEMBLY
- Publication number 20080074128
- Publication date Mar 27, 2008
- Kabushiki Kaisha Nihon Micronics
- Hideki HIRAKAWA
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR ELECTRICAL TEST AND PROBE ASSEMBLY
- Publication number 20070210813
- Publication date Sep 13, 2007
- KABUSHIKI KAISHA NIHON MICRONICS
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Application
Probe use in electric test
- Publication number 20070018633
- Publication date Jan 25, 2007
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Application
Fabrication method for semiconductor integrated circuit device
- Publication number 20040033692
- Publication date Feb 19, 2004
- Kazuo Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fabrication method for semiconductor integrated circuit devices and...
- Publication number 20020014662
- Publication date Feb 7, 2002
- Kazuo Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fabrication method for semiconductor integrated circuit devices and...
- Publication number 20010028093
- Publication date Oct 11, 2001
- Kazuo Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS

Shinji Kuniyoshi

Person

Patents Grantslast 30 patents

Probe and electrical connecting apparatus using it

Method for manufacturing an electrical test probe

Probe for electrical test and electrical connecting apparatus using it

Probe assembly, method of producing it and electrical connecting ap...

Electrical test probe

Electrical test probe and electrical test probe assembly

Probe board mounting apparatus

Probe for electrical test and probe assembly

Method of manufacturing a probe

Fabrication method for semiconductor integrated circuit device

Fabrication method for semiconductor integrated circuit devices and...

Fabrication method for semiconductor integrated circuit devices and...

Semiconductor integrated circuit device fabrication method and its...

Mask for exposing wafer with radiation and its exposing method

Pattern transistor mask and method of using the same

Method and apparatus for correcting defects of X-ray mask

Method of correcting defect in circuit pattern

Crystal monochromator

Mask for X-ray lithography and process for producing the same

Optical exposer

Pattern detector

Pattern detector

Pattern generator

Pattern forming apparatus

Automatic focusing apparatus

Pattern detecting apparatus

Reduction projection aligner system

Patents Applicationslast 30 patents

PROBE AND ELECTRICAL CONNECTING APPARATUS USING IT

ELECTRICAL TEST PROBE

PROBE ASSEMBLY, METHOD OF PRODUCING IT AND ELECTRICAL CONNECTING AP...

PROBE FOR ELECTRICAL TEST AND ELECTRICAL CONNECTING APPARATUS USING IT

Electrical Connecting Apparatus

ELECTRICAL TEST PROBE AND METHOD FOR MANUFACTURING THE SAME

PROBE AND METHOD FOR MANUFACTURING THE SAME

ELECTRICAL TEST PROBE AND ELECTRICAL TEST PROBE ASSEMBLY

PROBE FOR ELECTRICAL TEST AND PROBE ASSEMBLY

Probe use in electric test

Fabrication method for semiconductor integrated circuit device

Fabrication method for semiconductor integrated circuit devices and...

Fabrication method for semiconductor integrated circuit devices and...