Shinji SUGIHARA

Person

Niigata-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection apparatus and pattern outline position acquisiti...
- Patent number 11,569,057
- Issue date Jan 31, 2023
- NuFlare Technology, Inc.
- Shinji Sugihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 11,461,889
- Issue date Oct 4, 2022
- NuFlare Technology, Inc.
- Shinji Sugihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple electron beam irradiation apparatus, multiple electron bea...
- Patent number 11,004,657
- Issue date May 11, 2021
- NuFlare Technology, Inc.
- Shinji Sugihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic sensor
- Patent number 9,530,957
- Issue date Dec 27, 2016
- Alps Electric Co., Ltd.
- Shinji Sugihara
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic sensor for improving hysteresis and linearity
- Patent number 9,261,570
- Issue date Feb 16, 2016
- Alps Electric Co., Ltd.
- Masayuki Obana
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a magnetic sensor
- Patent number 9,207,293
- Issue date Dec 8, 2015
- Alps Electric Co., Ltd.
- Hideto Ando
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Defect detection method
- Patent number 9,194,817
- Issue date Nov 24, 2015
- Nuflare Technology, Inc.
- Shinji Sugihara
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 8,941,378
- Issue date Jan 27, 2015
- Alps Electric Co., Ltd.
- Masayuki Obana
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic detecting device and method for manufacturing the same
- Patent number 8,198,886
- Issue date Jun 12, 2012
- Alps Electric Co., Ltd.
- Shinji Sugihara
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Pattern image correcting apparatus, pattern inspection apparatus, a...
- Patent number 8,019,144
- Issue date Sep 13, 2011
- Kabushiki Kaisha Toshiba
- Shinji Sugihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic focus adjusting mechanism and optical image acquisition a...
- Patent number 8,004,655
- Issue date Aug 23, 2011
- Kabushiki Kaisha Toshiba
- Masataka Shiratsuchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Magnetic detection device
- Patent number 7,834,619
- Issue date Nov 16, 2010
- Alps Electric Co., Ltd.
- Hideto Ando
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Image density-adapted automatic mode switchable pattern correction...
- Patent number 7,787,686
- Issue date Aug 31, 2010
- Advanced Mask Inspection Technology
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask-defect inspecting apparatus with movable focusing lens
- Patent number 7,760,349
- Issue date Jul 20, 2010
- Kabushiki Kaisha TOPCON
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method and apparatus using linear predictive mod...
- Patent number 7,627,165
- Issue date Dec 1, 2009
- Advanced Mask Inspection Technology Inc.
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspecting method
- Patent number 7,590,277
- Issue date Sep 15, 2009
- Kabushiki Kaisha Toshiba
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image density-adapted automatic mode switchable pattern correction...
- Patent number 7,565,032
- Issue date Jul 21, 2009
- Advanced Mask Inspection Technology, Inc.
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask defect inspection apparatus
- Patent number 7,551,273
- Issue date Jun 23, 2009
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Image correction method
- Patent number 7,539,350
- Issue date May 26, 2009
- Advanced Mask Inspection Technology Inc.
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection system using image correction scheme with object...
- Patent number 7,487,491
- Issue date Feb 3, 2009
- Advanced Mask Inspection Technology Inc.
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask defect inspection apparatus
- Patent number 7,379,176
- Issue date May 27, 2008
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 7,359,546
- Issue date Apr 15, 2008
- Kabushiki Kaisha Toshiba
- Shinji Sugihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,209,584
- Issue date Apr 24, 2007
- Kabushiki Kaisha Toshiba
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic focusing apparatus
- Patent number 7,123,345
- Issue date Oct 17, 2006
- Kabushiki Kaisha Toshiba
- Shinji Sugihara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,068,364
- Issue date Jun 27, 2006
- Kabushiki Kaisha Toshiba
- Shinji Sugihara
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 6,883,160
- Issue date Apr 19, 2005
- Kabushiki Kaisha Toshiba
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray mask, method for fabricating the same, and pattern formation...
- Patent number 5,291,536
- Issue date Mar 1, 1994
- Kabushiki Kaisha Toshiba
- Masamitsu Itoh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND REFERENCE IMAGE GENERATION METHOD
- Publication number 20240257300
- Publication date Aug 1, 2024
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20240054633
- Publication date Feb 15, 2024
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20230251207
- Publication date Aug 10, 2023
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-ELECTRON BEAM INSPECTION DEVICE AND MULTI-ELECTRON BEAM INSPE...
- Publication number 20230170183
- Publication date Jun 1, 2023
- NuFlare Technology, Inc.
- Riki OGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN INSPECTION APPARATUS, AND METHOD FOR ACQUIRING ALIGNMENT AM...
- Publication number 20230145411
- Publication date May 11, 2023
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR SEARCHING FOR HOLE PATTERN IN IMAGE, PATTERN INSPECTION...
- Publication number 20220375195
- Publication date Nov 24, 2022
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN OUTLINE POSITION ACQUISITI...
- Publication number 20220013327
- Publication date Jan 13, 2022
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20210142457
- Publication date May 13, 2021
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE ELECTRON BEAM IRRADIATION APPARATUS, MULTIPLE ELECTRON BEA...
- Publication number 20200234919
- Publication date Jul 23, 2020
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEFECT DETECTION METHOD
- Publication number 20140055774
- Publication date Feb 27, 2014
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20130241545
- Publication date Sep 19, 2013
- ALPS Electric Co., Ltd.
- Masayuki OBANA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR FOR IMPROVING HYSTERESIS AND LINEARITY
- Publication number 20130181704
- Publication date Jul 18, 2013
- Alps Electric Co., Ltd.
- Masayuki OBANA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20120217961
- Publication date Aug 30, 2012
- Alps Electric Co., Ltd.
- Hideto ANDO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR AND MANUFACTURING METHOD THEREFOR
- Publication number 20120217962
- Publication date Aug 30, 2012
- Alps Electric Co., Ltd.
- Hideto ANDO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20120200292
- Publication date Aug 9, 2012
- Alps Electric Co., Ltd.
- Shinji SUGIHARA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC FOCUS ADJUSTING MECHANISM AND OPTICAL IMAGE ACQUISITION A...
- Publication number 20100247085
- Publication date Sep 30, 2010
- Kabushiki Kaisha Toshiba
- Masataka Shiratsuchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MAGNETIC DETECTION DEVICE
- Publication number 20100141251
- Publication date Jun 10, 2010
- Hideto Ando
- G01 - MEASURING TESTING
Information Patent Application
IMAGE DENSITY-ADAPTED AUTOMATIC MODE SWITCHABLE PATTERN CORRECTION...
- Publication number 20090245619
- Publication date Oct 1, 2009
- Advanced Mask Inspection Technology Inc.
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN IMAGE CORRECTING APPARATUS, PATTERN INSPECTION APPARATUS, A...
- Publication number 20090214104
- Publication date Aug 27, 2009
- Advanced Mask Inspection Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MAGNETORESISTIVE ELEMENT, MAGNETIC SENSOR, AND METHOD OF PRODUCING...
- Publication number 20090147409
- Publication date Jun 11, 2009
- Alps Electric Co., Ltd.
- Shinji Sugihara
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC DETECTING DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20090045810
- Publication date Feb 19, 2009
- Alps Electric Co., Ltd.
- Shinji Sugihara
- G01 - MEASURING TESTING
Information Patent Application
Mask defect inspection apparatus
- Publication number 20080204723
- Publication date Aug 28, 2008
- Kabushiki Kaisha TOPCON
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Application
Pattern inspection system using image correction scheme with object...
- Publication number 20070064993
- Publication date Mar 22, 2007
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image density-adapted automatic mode switchable pattern correction...
- Publication number 20070064995
- Publication date Mar 22, 2007
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection method and apparatus using linear predictive mod...
- Publication number 20070064996
- Publication date Mar 22, 2007
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern defect inspection method and apparatus using image correcti...
- Publication number 20060222233
- Publication date Oct 5, 2006
- Advanced Mask Inspection Technology Inc.
- Shinji Sugihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image correction method
- Publication number 20060215900
- Publication date Sep 28, 2006
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspecting method
- Publication number 20060018530
- Publication date Jan 26, 2006
- Kabushiki Kaisha Toshiba
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect inspection apparatus and defect inspection method
- Publication number 20050232477
- Publication date Oct 20, 2005
- Shinji Sugihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mask defect inspection apparatus
- Publication number 20050213083
- Publication date Sep 29, 2005
- Kabushiki Kaisha TOPCON
- Akihiko Sekine
- G01 - MEASURING TESTING

Shinji SUGIHARA

Person

Patents Grantslast 30 patents

Pattern inspection apparatus and pattern outline position acquisiti...

Pattern inspection apparatus and pattern inspection method

Multiple electron beam irradiation apparatus, multiple electron bea...

Magnetic sensor

Magnetic sensor for improving hysteresis and linearity

Method for manufacturing a magnetic sensor

Defect detection method

Magnetic sensor

Magnetic detecting device and method for manufacturing the same

Pattern image correcting apparatus, pattern inspection apparatus, a...

Automatic focus adjusting mechanism and optical image acquisition a...

Magnetic detection device

Image density-adapted automatic mode switchable pattern correction...

Mask-defect inspecting apparatus with movable focusing lens

Pattern inspection method and apparatus using linear predictive mod...

Pattern inspecting method

Image density-adapted automatic mode switchable pattern correction...

Mask defect inspection apparatus

Image correction method

Pattern inspection system using image correction scheme with object...

Mask defect inspection apparatus

Defect inspection apparatus and defect inspection method

Pattern inspection apparatus

Automatic focusing apparatus

Pattern inspection apparatus

Pattern inspection apparatus

X-ray mask, method for fabricating the same, and pattern formation...

Patents Applicationslast 30 patents

INSPECTION APPARATUS AND REFERENCE IMAGE GENERATION METHOD

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

MULTI-ELECTRON BEAM INSPECTION DEVICE AND MULTI-ELECTRON BEAM INSPE...

PATTERN INSPECTION APPARATUS, AND METHOD FOR ACQUIRING ALIGNMENT AM...

METHOD FOR SEARCHING FOR HOLE PATTERN IN IMAGE, PATTERN INSPECTION...

PATTERN INSPECTION APPARATUS AND PATTERN OUTLINE POSITION ACQUISITI...

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

MULTIPLE ELECTRON BEAM IRRADIATION APPARATUS, MULTIPLE ELECTRON BEA...

DEFECT DETECTION METHOD

MAGNETIC SENSOR

MAGNETIC SENSOR FOR IMPROVING HYSTERESIS AND LINEARITY

MAGNETIC SENSOR

MAGNETIC SENSOR AND MANUFACTURING METHOD THEREFOR

MAGNETIC SENSOR

AUTOMATIC FOCUS ADJUSTING MECHANISM AND OPTICAL IMAGE ACQUISITION A...

MAGNETIC DETECTION DEVICE

IMAGE DENSITY-ADAPTED AUTOMATIC MODE SWITCHABLE PATTERN CORRECTION...

PATTERN IMAGE CORRECTING APPARATUS, PATTERN INSPECTION APPARATUS, A...

MAGNETORESISTIVE ELEMENT, MAGNETIC SENSOR, AND METHOD OF PRODUCING...

MAGNETIC DETECTING DEVICE AND METHOD FOR MANUFACTURING THE SAME

Mask defect inspection apparatus

Pattern inspection system using image correction scheme with object...

Image density-adapted automatic mode switchable pattern correction...

Pattern inspection method and apparatus using linear predictive mod...

Pattern defect inspection method and apparatus using image correcti...

Image correction method

Pattern inspecting method

Defect inspection apparatus and defect inspection method

Mask defect inspection apparatus