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Shinnosuke NAKAMURA
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Kyoto-shi, Kyoto, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Sensor device
Patent number
12,031,946
Issue date
Jul 9, 2024
Kyocera Corporation
Shinnosuke Nakamura
G01 - MEASURING TESTING
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Patent Grant
Method of manufacturing sensor device and sensor device
Patent number
11,879,870
Issue date
Jan 23, 2024
Kyocera Corporation
Shinnosuke Nakamura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
GAS DETECTION APPARATUS AND GAS DETECTION SYSTEM
Publication number
20250102461
Publication date
Mar 27, 2025
KYOCERA CORPORATION
Emiko NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DEVICE
Publication number
20220229019
Publication date
Jul 21, 2022
KYOCERA CORPORATION
Shinnosuke NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING SENSOR DEVICE AND SENSOR DEVICE
Publication number
20220196610
Publication date
Jun 23, 2022
KYOCERA CORPORATION
Shinnosuke NAKAMURA
G01 - MEASURING TESTING