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Shintaro Yoshii
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Tokyo, JP
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last 30 patents
Information
Patent Grant
Impurity measuring method
Patent number
4,990,459
Issue date
Feb 5, 1991
Kabushiki Kaisha Toshiba
Ayako Maeda
G01 - MEASURING TESTING
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Patent Grant
Gettering method for a semiconductor wafer
Patent number
4,980,300
Issue date
Dec 25, 1990
Kabushiki Kaisha Toshiba
Moriya Miyashita
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Insulation film for a semiconductor device
Patent number
4,837,610
Issue date
Jun 6, 1989
Kabushiki Kaisha Toshiba
Hachiro Hiratsuka
H01 - BASIC ELECTRIC ELEMENTS