Shinya Goto

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Circuit element measuring apparatus and method for measuring a para...
- Patent number 5,216,373
- Issue date Jun 1, 1993
- Hewlett-Packard Company
- Hideki Wakamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Circuit element measuring method and apparatus
- Patent number 5,086,278
- Issue date Feb 4, 1992
- Hewlett-Packard Company
- Hideki Wakamatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PRIZE ACQUISITION GAME DEVICE
- Publication number 20240428662
- Publication date Dec 26, 2024
- Sega Corporation
- Kazuhiro Nagata
- G07 - CHECKING-DEVICES