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Shinya Soeda
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and method of fabricating the same
Patent number
6,822,279
Issue date
Nov 23, 2004
Renesas Technology Corp.
Shinya Soeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device, semiconductor device pattern designing method...
Patent number
6,680,539
Issue date
Jan 20, 2004
Renesas Technology Corp.
Hiroyasu Nohsoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device comprising a dual gate CMOS
Patent number
6,670,680
Issue date
Dec 30, 2003
Renesas Technology Corp.
Hiroyasu Nohsoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing semiconductor device
Patent number
6,607,964
Issue date
Aug 19, 2003
Mitsubishi Denki Kabushiki Kaisha
Hidenori Sato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method of manufacturing the same
Patent number
6,388,295
Issue date
May 14, 2002
Mitsubishi Denki Kabushiki Kaisha
Tomohiro Yamashita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of making a mask pattern
Patent number
6,355,387
Issue date
Mar 12, 2002
Mitsubishi Denki Kabushiki Kaisha
Masato Fujinaga
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Manufacturing method of a semiconductor device for desired circuit...
Patent number
6,331,462
Issue date
Dec 18, 2001
Mitsubishi Denki Kabushiki Kaisha
Tatsuo Kasaoka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Registration accuracy measurement mark, method of repairing defect...
Patent number
6,323,560
Issue date
Nov 27, 2001
Mitsubishi Denki Kabushiki Kaisha
Koichiro Narimatsu
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of manufacturing a DRAM and logic device
Patent number
6,218,235
Issue date
Apr 17, 2001
Mitsubishi Denki Kabushiki Kaisha
Atsushi Hachisuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Registration accuracy measurement mark, method of repairing defect...
Patent number
6,068,952
Issue date
May 30, 2000
Mitsubishi Denki Kabushiki Kaisha
Koichiro Narimatsu
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Registration accuracy measurement mark
Patent number
5,892,291
Issue date
Apr 6, 1999
Mitsubishi Denki Kabushiki Kaisha
Koichiro Narimatsu
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
DRAM having trench type capacitor extending through field oxide
Patent number
5,329,146
Issue date
Jul 12, 1994
Mitsubishi Denki Kabushiki Kaisha
Shinya Soeda
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Semiconductor device and process for same
Publication number
20040108553
Publication date
Jun 10, 2004
Renesas Technology Corp.
Hiroyasu Nohsoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and method of fabricating the same
Publication number
20030052352
Publication date
Mar 20, 2003
Mitsubishi Denki Kabushiki Kaisha
Shinya Soeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device, semiconductor device pattern designing method...
Publication number
20020195712
Publication date
Dec 26, 2002
Hiroyasu Nohsoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of manufacturing semiconductor device
Publication number
20020106855
Publication date
Aug 8, 2002
Hidenori Sato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and process for same
Publication number
20020093051
Publication date
Jul 18, 2002
Mitsubishi Denki Kabushiki Kaisha
Hiroyasu Nohsoh
H01 - BASIC ELECTRIC ELEMENTS