Shoichi YASUKAWA

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Patents Grantslast 30 patents

Information Patent Grant
X-ray stress analysis apparatus, method, and program
- Patent number 10,401,310
- Issue date Sep 3, 2019
- Rigaku Corporation
- Shoichi Yasukawa
- G01 - MEASURING TESTING
Information Patent Grant
X-RAY diffraction apparatus, X-RAY diffraction measuring method, an...
- Patent number 9,347,895
- Issue date May 24, 2016
- Rigaku Corporation
- Shoichi Yasukawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray residual stress measuring instrument
- Patent number D750783
- Issue date Mar 1, 2016
- Rigaku Corporation
- Shoichi Yasukawa
- D24 - Medical and laboratory equipment
Information Patent Grant
X-ray stress measurement method and apparatus
- Patent number 8,953,743
- Issue date Feb 10, 2015
- Rigaku Corporation
- Shoichi Yasukawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray stress measurement apparatus
- Patent number 8,855,266
- Issue date Oct 7, 2014
- Rigaku Corporation
- Shoichi Yasukawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for estimating specific polymer crystal
- Patent number 7,342,995
- Issue date Mar 11, 2008
- Rigaku Corporation
- Takahisa Sato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STRESS ANALYSIS APPARATUS, METHOD, AND PROGRAM
- Publication number 20170082561
- Publication date Mar 23, 2017
- Rigaku Corporation
- Shoichi YASUKAWA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS, X-RAY DIFFRACTION MEASURING METHOD, AN...
- Publication number 20140314206
- Publication date Oct 23, 2014
- Rigaku Corporation
- Shoichi YASUKAWA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY STRESS MEASUREMENT METHOD AND APPARATUS
- Publication number 20140029726
- Publication date Jan 30, 2014
- Shoichi Yasukawa
- G01 - MEASURING TESTING
Information Patent Application
X-RAY STRESS MEASUREMENT APPARATUS
- Publication number 20130039469
- Publication date Feb 14, 2013
- Rigaku Corporation
- Shoichi Yasukawa
- G01 - MEASURING TESTING
Information Patent Application
Specific macromolecule crystal evaluator
- Publication number 20060266954
- Publication date Nov 30, 2006
- Rigaku Corporation
- Takahisa Sato
- G01 - MEASURING TESTING