-
EXPOSURE APPARATUS AND EXPOSURE METHOD
-
Publication number 20170090298
-
Publication date Mar 30, 2017
-
Advantest Corporation
-
Shoji KOJIMA
-
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
-
MULTI-VALUED DRIVER CIRCUIT
-
Publication number 20120201284
-
Publication date Aug 9, 2012
-
Advantest Corporation
-
Shoji Kojima
-
H04 - ELECTRIC COMMUNICATION TECHNIQUE
-
DIGITAL TO ANALOG CONVERTER
-
Publication number 20120194374
-
Publication date Aug 2, 2012
-
Advantest Corporation
-
Ken'ichi Sawada
-
H03 - BASIC ELECTRONIC CIRCUITRY
-
SR FLIP-FLOP
-
Publication number 20120161840
-
Publication date Jun 28, 2012
-
Advantest Corporation
-
Shoji Kojima
-
H03 - BASIC ELECTRONIC CIRCUITRY
-
DRIVER CIRCUIT
-
Publication number 20120153975
-
Publication date Jun 21, 2012
-
Advantest Corporation
-
Yasuyuki Arai
-
G01 - MEASURING TESTING
-
-
VARIABLE EQUALIZER CIRCUIT
-
Publication number 20120043968
-
Publication date Feb 23, 2012
-
Advantest Corporation
-
Shoji Kojima
-
H04 - ELECTRIC COMMUNICATION TECHNIQUE
-
DIFFERENTIAL DRIVER CIRCUIT
-
Publication number 20110234317
-
Publication date Sep 29, 2011
-
Advantest Corporation
-
Yasuyuki Arai
-
H03 - BASIC ELECTRONIC CIRCUITRY
-
-
DIFFERENTIAL SR FLIP-FLOP
-
Publication number 20110166819
-
Publication date Jul 7, 2011
-
Advantest Corporation
-
Shoji Kojima
-
H03 - BASIC ELECTRONIC CIRCUITRY
-
LEVEL SHIFTER USING SR-FLIP FLOP
-
Publication number 20110140750
-
Publication date Jun 16, 2011
-
Advantest Corporation
-
Shoji Kojima
-
H03 - BASIC ELECTRONIC CIRCUITRY
-
COMPARISON JUDGMENT CIRCUIT
-
Publication number 20110121904
-
Publication date May 26, 2011
-
Advantest Corporation
-
Shoji Kojima
-
G01 - MEASURING TESTING
-
-
-
EQUALIZER CIRCUIT
-
Publication number 20110051798
-
Publication date Mar 3, 2011
-
Advantest Corporation
-
Shoji Kojima
-
H04 - ELECTRIC COMMUNICATION TECHNIQUE
-
-
DRIVER COMPARATOR CIRCUIT
-
Publication number 20100271080
-
Publication date Oct 28, 2010
-
Advantest Corporation
-
Shoji Kojima
-
H04 - ELECTRIC COMMUNICATION TECHNIQUE
-
Comparator with latching function
-
Publication number 20100213966
-
Publication date Aug 26, 2010
-
Advantest Corporation, a Japanese Corporation
-
Shoji Kojima
-
G01 - MEASURING TESTING
-
-
DIFFERENTIAL HYBRID CIRCUIT
-
Publication number 20100176846
-
Publication date Jul 15, 2010
-
Advantest Corporation
-
Shoji Kojima
-
G01 - MEASURING TESTING
-
-
-
SEMICONDUCTOR CIRCUIT
-
Publication number 20100060336
-
Publication date Mar 11, 2010
-
Advantest Corporation
-
Shoji Kojima
-
H03 - BASIC ELECTRONIC CIRCUITRY
-
-
-
-
VERNIER DELAY CIRCUIT
-
Publication number 20090273384
-
Publication date Nov 5, 2009
-
Advantest Corporation
-
Shoji Kojima
-
H03 - BASIC ELECTRONIC CIRCUITRY
-
PRIORITY ENCODER
-
Publication number 20090251939
-
Publication date Oct 8, 2009
-
Advantest Coporation
-
Shoji Kojima
-
G06 - COMPUTING CALCULATING COUNTING
-
SEMICONDUCTOR CIRCUIT
-
Publication number 20090251001
-
Publication date Oct 8, 2009
-
Advantest Corporation
-
Shoji Kojima
-
H03 - BASIC ELECTRONIC CIRCUITRY
-