Shuai Li

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for predicting traffic flow or travel time period
- Patent number 12,165,506
- Issue date Dec 10, 2024
- Alibaba Group Holding Limited
- Shenkun Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 12,087,541
- Issue date Sep 10, 2024
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Curved liquid crystal display panel and curved display device
- Patent number 12,072,590
- Issue date Aug 27, 2024
- CHENGDU BOE DISPLAY SCI-TECH CO., LTD.
- Yanxue Zhang
- G02 - OPTICS
Information Patent Grant
Objective lens system for fast scanning large FOV
- Patent number 11,837,431
- Issue date Dec 5, 2023
- ASML Netherlands B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscope
- Patent number 11,798,781
- Issue date Oct 24, 2023
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 11,705,304
- Issue date Jul 18, 2023
- ASML Netherlands B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 11,688,580
- Issue date Jun 27, 2023
- ASML Netherlands B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging system and method for specimen detection
- Patent number 11,598,732
- Issue date Mar 7, 2023
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 11,217,423
- Issue date Jan 4, 2022
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope with composite detection system and sp...
- Patent number 11,145,487
- Issue date Oct 12, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 11,107,657
- Issue date Aug 31, 2021
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope objective lens system and method for s...
- Patent number 11,075,056
- Issue date Jul 27, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 11,062,877
- Issue date Jul 13, 2021
- ASML Netherlands B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 11,043,354
- Issue date Jun 22, 2021
- ASML Netherlands B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic lens and exciting current control method
- Patent number 10,923,312
- Issue date Feb 16, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum condition processing apparatus, system and method for specim...
- Patent number 10,903,039
- Issue date Jan 26, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system, opto-electro simultaneous detection s...
- Patent number 10,879,036
- Issue date Dec 29, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- G02 - OPTICS
Information Patent Grant
Low voltage scanning electron microscope and method for specimen ob...
- Patent number 10,777,382
- Issue date Sep 15, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum condition controlling apparatus, system and method for speci...
- Patent number 10,699,874
- Issue date Jun 30, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,643,820
- Issue date May 5, 2020
- Hermes Microvision Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,573,487
- Issue date Feb 25, 2020
- ASML Netherlands B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,541,110
- Issue date Jan 21, 2020
- ASML Netherlands B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,276,347
- Issue date Apr 30, 2019
- Hermes Microvision Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,236,156
- Issue date Mar 19, 2019
- Hermes Microvision Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,115,559
- Issue date Oct 30, 2018
- Hermes-Microvision, Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,109,456
- Issue date Oct 23, 2018
- Hermes Microvision Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens system for fast scanning large FOV
- Patent number 10,008,360
- Issue date Jun 26, 2018
- Hermes Microvision Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 9,922,799
- Issue date Mar 20, 2018
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 9,691,586
- Issue date Jun 27, 2017
- Hermes-Microvision, Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 9,691,588
- Issue date Jun 27, 2017
- Hermes-Microvision, Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD, APPARATUS, DEVICE, AND MEDIUM FOR ACTION EXECUTION
- Publication number 20240330707
- Publication date Oct 3, 2024
- Douyin Vision Co., Ltd.
- Anran XU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBJECTIVE LENS SYSTEM FOR FAST SCANNING LARGE FOV
- Publication number 20240145209
- Publication date May 2, 2024
- ASML NETHERLANDS B.V.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CURVED LIQUID CRYSTAL DISPLAY PANEL AND CURVED DISPLAY DEVICE
- Publication number 20240069395
- Publication date Feb 29, 2024
- CHENGDU BOE DISPLAY SCI-TECH CO., LTD.
- Yanxue ZHANG
- G02 - OPTICS
Information Patent Application
VISCOUS FLUID SIMULATION METHOD BASED ON YIELD CRITERION CONSTRAINT
- Publication number 20240028800
- Publication date Jan 25, 2024
- BEIHANG UNIVERSITY
- Yang GAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20240014003
- Publication date Jan 11, 2024
- ASML NETHERLANDS B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING INFORMATION, REMOTE TERMINAL, AND MOWER
- Publication number 20230320263
- Publication date Oct 12, 2023
- Willand (Beijing) Technology Co., LTD.
- Zichong CHEN
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
ELECTRON BEAM SYSTEM
- Publication number 20230317404
- Publication date Oct 5, 2023
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROCESSING METHOD AND APPARATUS, AND METHOD AND APPARATUS FOR...
- Publication number 20230230204
- Publication date Jul 20, 2023
- Luhui XU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20230028903
- Publication date Jan 26, 2023
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOUSE-RENTING RECOMMENDATION METHOD, ELECTRONIC DEVICE AND STORAGE...
- Publication number 20220172310
- Publication date Jun 2, 2022
- BEIJING BAIDU NETCOM SCIENCE TECHNOLOGY CO., LTD.
- An ZHUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20220148851
- Publication date May 12, 2022
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPE
- Publication number 20220108870
- Publication date Apr 7, 2022
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20210391138
- Publication date Dec 16, 2021
- ASML NETHERLANDS B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20210384008
- Publication date Dec 9, 2021
- ASML NETHERLANDS B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR PREDICTING TRAFFIC FLOW OR TRAVEL TIME PERIOD
- Publication number 20210233391
- Publication date Jul 29, 2021
- ALIBABA GROUP HOLDING LIMITED
- Shenkun XU
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM AND METHOD FOR SPECIMEN DETECTION
- Publication number 20210231589
- Publication date Jul 29, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei HE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE OBJECTIVE LENS SYSTEM AND METHOD FOR S...
- Publication number 20210110994
- Publication date Apr 15, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE WITH COMPOSITE DETECTION SYSTEM AND SP...
- Publication number 20210066031
- Publication date Mar 4, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20200388464
- Publication date Dec 10, 2020
- ASML Netherlands B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MODELING METHOD, APPARATUS, DEVICE AND STORAGE MEDIUM OF DYNAMIC CA...
- Publication number 20200357162
- Publication date Nov 12, 2020
- BEIHANG UNIVERSITY
- SHUAI LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20200286705
- Publication date Sep 10, 2020
- ASML NETHERLANDS B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW VOLTAGE SCANNING ELECTRON MICROSCOPE AND METHOD FOR SPECIMEN OB...
- Publication number 20200234914
- Publication date Jul 23, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20200152421
- Publication date May 14, 2020
- ASML NETHERLANDS B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM CONDITION PROCESSING APPARATUS, SYSTEM AND METHOD FOR SPECIM...
- Publication number 20200035443
- Publication date Jan 30, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM CONDITION CONTROLLING APPARATUS, SYSTEM AND METHOD FOR SPECI...
- Publication number 20200035448
- Publication date Jan 30, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC LENS AND EXCITING CURRENT CONTROL METHOD
- Publication number 20190295808
- Publication date Sep 26, 2019
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM, OPTO-ELECTRO SIMULTANEOUS DETECTION S...
- Publication number 20190287760
- Publication date Sep 19, 2019
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20190279842
- Publication date Sep 12, 2019
- ASML Netherlands B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20190259573
- Publication date Aug 22, 2019
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECTIVE LENS SYSTEM FOR FAST SCANNING LARGE FOV
- Publication number 20190096628
- Publication date Mar 28, 2019
- HERMES MICROVISION, INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Method and device for predicting traffic flow or travel time period

Apparatus of plural charged-particle beams

Curved liquid crystal display panel and curved display device

Objective lens system for fast scanning large FOV

Microscope

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Imaging system and method for specimen detection

Apparatus of plural charged-particle beams

Scanning electron microscope with composite detection system and sp...

Apparatus of plural charged-particle beams

Scanning electron microscope objective lens system and method for s...

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Magnetic lens and exciting current control method

Vacuum condition processing apparatus, system and method for specim...

Charged particle beam system, opto-electro simultaneous detection s...

Low voltage scanning electron microscope and method for specimen ob...

Vacuum condition controlling apparatus, system and method for speci...

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Objective lens system for fast scanning large FOV

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Patents Applicationslast 30 patents

METHOD, APPARATUS, DEVICE, AND MEDIUM FOR ACTION EXECUTION

OBJECTIVE LENS SYSTEM FOR FAST SCANNING LARGE FOV

CURVED LIQUID CRYSTAL DISPLAY PANEL AND CURVED DISPLAY DEVICE

VISCOUS FLUID SIMULATION METHOD BASED ON YIELD CRITERION CONSTRAINT

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

METHOD FOR DETERMINING INFORMATION, REMOTE TERMINAL, AND MOWER

ELECTRON BEAM SYSTEM

IMAGE PROCESSING METHOD AND APPARATUS, AND METHOD AND APPARATUS FOR...

ELECTRON MICROSCOPE

HOUSE-RENTING RECOMMENDATION METHOD, ELECTRONIC DEVICE AND STORAGE...

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

MICROSCOPE

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

METHOD AND DEVICE FOR PREDICTING TRAFFIC FLOW OR TRAVEL TIME PERIOD

IMAGING SYSTEM AND METHOD FOR SPECIMEN DETECTION

SCANNING ELECTRON MICROSCOPE OBJECTIVE LENS SYSTEM AND METHOD FOR S...

SCANNING ELECTRON MICROSCOPE WITH COMPOSITE DETECTION SYSTEM AND SP...

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

MODELING METHOD, APPARATUS, DEVICE AND STORAGE MEDIUM OF DYNAMIC CA...

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

LOW VOLTAGE SCANNING ELECTRON MICROSCOPE AND METHOD FOR SPECIMEN OB...

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

VACUUM CONDITION PROCESSING APPARATUS, SYSTEM AND METHOD FOR SPECIM...

VACUUM CONDITION CONTROLLING APPARATUS, SYSTEM AND METHOD FOR SPECI...

MAGNETIC LENS AND EXCITING CURRENT CONTROL METHOD

CHARGED PARTICLE BEAM SYSTEM, OPTO-ELECTRO SIMULTANEOUS DETECTION S...

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

OBJECTIVE LENS SYSTEM FOR FAST SCANNING LARGE FOV