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Shuhei Kaneko

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  • Kobe, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    SAMPLE MEASURING APPARATUS AND SAMPLE MEASURING METHOD
    • Publication number 20230390767
    • Publication date Dec 7, 2023
    • SYSMEX CORPORATION
    • Masato HAYASHI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    SAMPLE MEASURING APPARATUS
    • Publication number 20230390766
    • Publication date Dec 7, 2023
    • SYSMEX CORPORATION
    • Masato HAYASHI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    IMMUNOASSAY APPARATUS
    • Publication number 20200256868
    • Publication date Aug 13, 2020
    • SYSMEX CORPORATION
    • Toshiyuki SATO
    • G01 - MEASURING TESTING
  • Information Patent Application

    IMMUNOASSAY APPARATUS
    • Publication number 20180024128
    • Publication date Jan 25, 2018
    • SYSMEX CORPORATION
    • Toshiyuki SATO
    • G01 - MEASURING TESTING
  • Information Patent Application

    CUVETTE SUPPLYING DEVICE AND SPECIMEN ANALYZER
    • Publication number 20150316467
    • Publication date Nov 5, 2015
    • Sysmex Corporation
    • Shuhei KANEKO
    • G01 - MEASURING TESTING
  • Information Patent Application

    CUVETTE SUPPLYING DEVICE AND SPECIMEN ANALYZER
    • Publication number 20120171078
    • Publication date Jul 5, 2012
    • Shuhei Kaneko
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANALYZER
    • Publication number 20100248346
    • Publication date Sep 30, 2010
    • SYSMEX CORPORATION
    • Shuhei KANEKO
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample Analyzer and Its Components
    • Publication number 20080219886
    • Publication date Sep 11, 2008
    • Toshikatsu Fukuju
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    SAMPLE ANALYZER AND ITS COMPONENTS
    • Publication number 20080063568
    • Publication date Mar 13, 2008
    • Toshikatsu Fukuju
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Sample analyzer and sample analyzing method
    • Publication number 20080011106
    • Publication date Jan 17, 2008
    • Nobuhiro Kitagawa
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Sample analyzer
    • Publication number 20080014118
    • Publication date Jan 17, 2008
    • Nobuhiro Kitagawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    Liquid sample suctioning device and analyzer
    • Publication number 20070062316
    • Publication date Mar 22, 2007
    • Sysmex Corporation
    • Nobuhiro Kitagawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample analyzer and its components
    • Publication number 20040105784
    • Publication date Jun 3, 2004
    • Toshikatsu Fukuju
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic sample analyzer and its components
    • Publication number 20030070498
    • Publication date Apr 17, 2003
    • Yasuhiro Ohyama
    • G01 - MEASURING TESTING