Shun Kumano

Person

Kokubunji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Substance analyzer and substance analysis method
- Patent number 11,776,800
- Issue date Oct 3, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adhering substance collecting device and inspection system
- Patent number 11,371,915
- Issue date Jun 28, 2022
- Hitachi, Ltd.
- Shun Kumano
- G01 - MEASURING TESTING
Information Patent Grant
Sample fragmentation device using heating and pressure regulation b...
- Patent number 11,101,121
- Issue date Aug 24, 2021
- HITACHI HIGH-TECH CORPORATION
- Hideki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for preparing standard sample for gas flow type analysis system
- Patent number 10,989,632
- Issue date Apr 27, 2021
- Hitachi, Ltd.
- Yasuaki Takada
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer and mass analyzing method for efficiently ionizin...
- Patent number 9,543,135
- Issue date Jan 10, 2017
- Hitachi High-Technologies Corporation
- Shun Kumano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric system
- Patent number 9,287,105
- Issue date Mar 15, 2016
- Hitachi High-Technologies Corporation
- Yohei Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 9,281,169
- Issue date Mar 8, 2016
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass analyzing method
- Patent number 9,184,037
- Issue date Nov 10, 2015
- Hitachi High-Technologies Corporation
- Shun Kumano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer method and mass spectrometer
- Patent number 9,076,638
- Issue date Jul 7, 2015
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 9,006,679
- Issue date Apr 14, 2015
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry method
- Patent number 8,710,430
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and computer program products for mass spectrometry
- Patent number 8,686,352
- Issue date Apr 1, 2014
- Hitachi, Ltd.
- Yohei Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20240038524
- Publication date Feb 1, 2024
- Hitachi, Ltd
- Masuyuki SUGIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING PROTEIN
- Publication number 20230416301
- Publication date Dec 28, 2023
- Hitachi, Ltd
- Masashi Maruyama
- C07 - ORGANIC CHEMISTRY
Information Patent Application
ATTACHED SUBSTANCE COLLECTION DEVICE AND ATTACHED SUBSTANCE ANALYSI...
- Publication number 20220373434
- Publication date Nov 24, 2022
- Hitachi, Ltd
- Shun KUMANO
- G01 - MEASURING TESTING
Information Patent Application
SUBSTANCE ANALYZER AND SUBSTANCE ANALYSIS METHOD
- Publication number 20220359182
- Publication date Nov 10, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasuaki TAKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Adhering Substance Collecting Device and Inspection System
- Publication number 20200319061
- Publication date Oct 8, 2020
- Hitachi, Ltd
- Shun KUMANO
- G01 - MEASURING TESTING
Information Patent Application
ADHERED MATTER INSPECTION METHOD
- Publication number 20200193545
- Publication date Jun 18, 2020
- Hitachi, Ltd
- Shun KUMANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHEMICAL ANALYSIS APPARATUS
- Publication number 20180196017
- Publication date Jul 12, 2018
- Hitachi, Ltd
- Shinichi TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Method for Preparing Standard Sample for Gas Flow Type Analysis System
- Publication number 20180149563
- Publication date May 31, 2018
- Hitachi, Ltd
- Yasuaki TAKADA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE FRAGMENTATION DEVICE
- Publication number 20180114682
- Publication date Apr 26, 2018
- Hitachi High-Technologies Corporation
- Hideki HASEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20150187554
- Publication date Jul 2, 2015
- Hitachi High-Technologies Corporation
- Hidetoshi MOROKUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20130320207
- Publication date Dec 5, 2013
- Hidetoshi MOROKUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometric System
- Publication number 20130228677
- Publication date Sep 5, 2013
- Hitachi High-Technologies Corporation
- Yohei KAWAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS ANALYZING METHOD
- Publication number 20130048851
- Publication date Feb 28, 2013
- Hitachi High-Technologies Corporation
- Shun KUMANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY METHOD
- Publication number 20120326027
- Publication date Dec 27, 2012
- Hitachi High-Technologies Corporation
- Masuyuki SUGIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS ANALYZING METHOD
- Publication number 20120326022
- Publication date Dec 27, 2012
- Shun KUMANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND COMPUTER PROGRAM PRODUCTS FOR MASS SPECTROMETRY
- Publication number 20120298852
- Publication date Nov 29, 2012
- Hitachi, Ltd.
- Yohei Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER METHOD AND MASS SPECTROMETER
- Publication number 20120223223
- Publication date Sep 6, 2012
- Hitachi High-Technologies Corporation
- Masuyuki SUGIYAMA
- H01 - BASIC ELECTRIC ELEMENTS

Shun Kumano

Person

Patents Grantslast 30 patents

Substance analyzer and substance analysis method

Adhering substance collecting device and inspection system

Sample fragmentation device using heating and pressure regulation b...

Method for preparing standard sample for gas flow type analysis system

Mass spectrometer and mass analyzing method for efficiently ionizin...

Mass spectrometric system

Mass spectrometer

Mass spectrometer and mass analyzing method

Mass spectrometer method and mass spectrometer

Mass spectrometer

Mass spectrometry method

Systems and computer program products for mass spectrometry

Patents Applicationslast 30 patents

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

METHOD FOR ANALYZING PROTEIN

ATTACHED SUBSTANCE COLLECTION DEVICE AND ATTACHED SUBSTANCE ANALYSI...

SUBSTANCE ANALYZER AND SUBSTANCE ANALYSIS METHOD

Adhering Substance Collecting Device and Inspection System

ADHERED MATTER INSPECTION METHOD

CHEMICAL ANALYSIS APPARATUS

Method for Preparing Standard Sample for Gas Flow Type Analysis System

SAMPLE FRAGMENTATION DEVICE

MASS SPECTROMETER

MASS SPECTROMETER

Mass Spectrometric System

MASS SPECTROMETER AND MASS ANALYZING METHOD

MASS SPECTROMETRY METHOD

MASS SPECTROMETER AND MASS ANALYZING METHOD

SYSTEMS AND COMPUTER PROGRAM PRODUCTS FOR MASS SPECTROMETRY

MASS SPECTROMETER METHOD AND MASS SPECTROMETER