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Shunsuke Koshihara
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for measuring sample and measurement device
Patent number
8,581,187
Issue date
Nov 12, 2013
Hitachi High-Technologies Corporation
Mihoko Kijima
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method for adjusting imaging magnification and charged particle bea...
Patent number
8,552,371
Issue date
Oct 8, 2013
Hitachi High-Technologies Corporation
Shigeki Sukegawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Template creation method and image processor therefor
Patent number
8,180,140
Issue date
May 15, 2012
Hitachi High-Technologies Corporation
Kyoungmo Yang
G01 - MEASURING TESTING
Information
Patent Grant
Method for adjusting imaging magnification and charged particle bea...
Patent number
7,834,316
Issue date
Nov 16, 2010
Hitachi High-Technologies Corporation
Shigeki Sukegawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope
Patent number
7,521,695
Issue date
Apr 21, 2009
Hitachi, Ltd.
Yoshinori Nakada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope
Patent number
7,217,925
Issue date
May 15, 2007
Hitachi, Ltd.
Yoshinori Nakada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope
Patent number
7,009,178
Issue date
Mar 7, 2006
Hitachi, Ltd.
Yoshinori Nakada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope
Patent number
6,897,445
Issue date
May 24, 2005
Hitachi, Ltd.
Yoshinori Nakada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope
Patent number
6,713,761
Issue date
Mar 30, 2004
Hitachi, Ltd.
Yoshinori Nakada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Energy dispersive X-ray analyzer
Patent number
5,903,004
Issue date
May 11, 1999
Hitachi, Ltd.
Shunsuke Koshihara
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Image Processor, Method for Generating Pattern Using Self-Organizin...
Publication number
20180181009
Publication date
Jun 28, 2018
Hitachi High-Technologies Corporation
Takumichi SUTANI
B82 - NANO-TECHNOLOGY
Information
Patent Application
IMAGE PROCESSOR, METHOD FOR GENERATING PATTERN USING SELF- ORGANIZI...
Publication number
20150277237
Publication date
Oct 1, 2015
Hitachi High-Technologies Corporation
Takumichi Sutani
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD FOR MEASURING SAMPLE AND MEASUREMENT DEVICE
Publication number
20110139982
Publication date
Jun 16, 2011
Hitachi High-Technologies Corporation
Mihoko Kijima
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Wafer Inspection
Publication number
20110096309
Publication date
Apr 28, 2011
IMEC
Vincent Jean-Marie Pierre Paul Wiaux
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD FOR ADJUSTING IMAGING MAGNIFICATION AND CHARGED PARTICLE BEA...
Publication number
20110042568
Publication date
Feb 24, 2011
Hitachi High-Technologies Corporation
SHIGEKI SUKEGAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEMPLATE CREATION METHOD AND IMAGE PROCESSOR THEREFOR
Publication number
20090304286
Publication date
Dec 10, 2009
Kyoungmo Yang
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ADJUSTING IMAGING MAGNIFICATION AND CHARGED PARTICLE BEA...
Publication number
20080217529
Publication date
Sep 11, 2008
Shigeki SUKEGAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning electron microscope
Publication number
20070194234
Publication date
Aug 23, 2007
Yoshinori Nakada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning electron microscope
Publication number
20060102840
Publication date
May 18, 2006
Yoshinori Nakada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning electron microscope
Publication number
20050178965
Publication date
Aug 18, 2005
Yoshinori Nakada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning electron microscope
Publication number
20040094713
Publication date
May 20, 2004
Yoshinori Nakada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning electron microscope
Publication number
20010054692
Publication date
Dec 27, 2001
Yoshinori Nakada
H01 - BASIC ELECTRIC ELEMENTS