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Patents Grants
last 30 patents
Information
Patent Grant
Heterogenous voltage-based testing via on-chip voltage regulator ci...
Patent number
11,808,805
Issue date
Nov 7, 2023
NVIDIA Corporation
Francisco Da Silva
G01 - MEASURING TESTING
Information
Patent Grant
Timing-aware testing
Patent number
11,328,112
Issue date
May 10, 2022
NVIDIA Corporation
Shang-Ju Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image-capturing device and method for operating image-capturing sys...
Patent number
11,140,327
Issue date
Oct 5, 2021
Aver Information Inc.
Kuo-Hao Huang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
Patent number
9,696,377
Issue date
Jul 4, 2017
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Computer-aided design system to automate scan synthesis at register...
Patent number
8,543,950
Issue date
Sep 24, 2013
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Grant
Orthogonal-polarization mirau interferometry and beam-splitting mod...
Patent number
8,334,981
Issue date
Dec 18, 2012
National Taipei University of Technology
Sheng-Lih Yeh
G01 - MEASURING TESTING
Information
Patent Grant
Vibration-resistant interferometric scanning system and method thereof
Patent number
7,855,791
Issue date
Dec 21, 2010
National Taipei University of Technology
Sheng-Lih Yeh
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
Patent number
7,721,173
Issue date
May 18, 2010
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
Patent number
7,552,373
Issue date
Jun 23, 2009
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for shifting at-speed scan patterns in a scan-...
Patent number
7,512,851
Issue date
Mar 31, 2009
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for unifying self-test with scan-test during p...
Patent number
7,444,567
Issue date
Oct 28, 2008
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
Patent number
7,412,672
Issue date
Aug 12, 2008
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Computer-aided design system to automate scan synthesis at register...
Patent number
7,331,032
Issue date
Feb 12, 2008
Syntest Technologies, Inc.
Laung-Terng (L. -T.) Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
IEEE Std. 1149.4 compatible analog BIST methodology
Patent number
7,228,479
Issue date
Jun 5, 2007
Syntest Technologies, Inc.
Chauchin Su
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for diagnosing failures in an integrated circu...
Patent number
7,191,373
Issue date
Mar 13, 2007
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Grant
Four-field motion adaptive de-interlacing
Patent number
7,129,989
Issue date
Oct 31, 2006
Avermedia Technologies, Inc.
Liang-Gee Chen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Computer-aided design system to automate scan synthesis at register...
Patent number
6,957,403
Issue date
Oct 18, 2005
Syntest Technologies, Inc.
Laung-Terng Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for measuring effective gate channel length during C-V method
Patent number
6,514,778
Issue date
Feb 4, 2003
United Microelectronics Corp.
Heng-Seng Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for generating a grating image
Patent number
6,473,443
Issue date
Oct 29, 2002
Kutai Electrical Industrial Co., Ltd.
Chi-Wang Kuo
G02 - OPTICS
Information
Patent Grant
Intake swirl enhancing structure for internal combustion engine
Patent number
6,041,753
Issue date
Mar 28, 2000
Industrial Technology Research Institute, China Motor Corporation
Shyh-Shyan Lin
F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information
Patent Grant
Catalytic converter provided with vortex generator
Patent number
5,916,134
Issue date
Jun 29, 1999
Industrial Technology Research Institute
Jyh-Chyang Yang
F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Patents Applications
last 30 patents
Information
Patent Application
TRANSPARENCY ADJUSTMENT METHOD AND DOCUMENT CAMERA
Publication number
20210352181
Publication date
Nov 11, 2021
AVer Information Inc.
Shyh-Feng LIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE-CAPTURING DEVICE AND METHOD FOR OPERATING IMAGE-CAPTURING SYSTEM
Publication number
20200007777
Publication date
Jan 2, 2020
AVer Information Inc.
Kuo-Hao HUANG
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
COMPUTER-AIDED DESIGN SYSTEM TO AUTOMATE SCAN SYNTHESIS AT REGISTER...
Publication number
20120246604
Publication date
Sep 27, 2012
Syntest Technologies, Inc.
Laung-Terng (L. -T.) WANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PRESENTATION METHOD AND PRESENTATION SYSTEM USING IDENTIFICATION LABEL
Publication number
20110131498
Publication date
Jun 2, 2011
AVERMEDIA INFORMATION, INC.
Kuo-Chuan Chao
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
ORTHOGONAL-POLARIZATION MIRAU INTERFEROMETRY AND BEAM-SPLITTING MOD...
Publication number
20100214570
Publication date
Aug 26, 2010
National Taipei University of Technology
Sheng-Lih Yeh
G01 - MEASURING TESTING
Information
Patent Application
VIBRATION-RESISTANT INTERFEROMETRIC SCANNING SYSTEM AND METHOD THEREOF
Publication number
20100033733
Publication date
Feb 11, 2010
National Taipei University of Technology
Sheng-Lih Yeh
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR BROADCASTING SCAN PATTERNS IN A SCAN-BASED...
Publication number
20090235132
Publication date
Sep 17, 2009
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for unifying self-test with scan-test during p...
Publication number
20090037786
Publication date
Feb 5, 2009
Syntest Technologies, Inc.
Laung-Terng Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for broadcasting scan patterns in a scan-based...
Publication number
20080276141
Publication date
Nov 6, 2008
Syntest Technologies Inc.
Laung-Terng(L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Application
IEEE Std. 1149.4 compatible analog BIST methodology
Publication number
20060059395
Publication date
Mar 16, 2006
Chauchin Su
G01 - MEASURING TESTING
Information
Patent Application
Computer-aided design system to automate scan synthesis at register...
Publication number
20050229123
Publication date
Oct 13, 2005
Syntest Technologies, Inc.
Laung-Terng Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for shifting at-speed scan patterns in a scan-...
Publication number
20050055617
Publication date
Mar 10, 2005
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Four-field motion adaptive de-interlacing
Publication number
20050036063
Publication date
Feb 17, 2005
Liang-Gee Chen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method and apparatus for unifying self-test with scan-test during p...
Publication number
20040268181
Publication date
Dec 30, 2004
Laung-Terng Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for broadcasting scan patterns in a scan-based...
Publication number
20030154433
Publication date
Aug 14, 2003
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Computer-aided design system to automate scan synthesis at register...
Publication number
20030023941
Publication date
Jan 30, 2003
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and system to optimize test cost and disable defects for sca...
Publication number
20020194558
Publication date
Dec 19, 2002
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for diagnosing failures in an integrated circu...
Publication number
20020138801
Publication date
Sep 26, 2002
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Method for measuring effective gate channel length during C-V method
Publication number
20020102752
Publication date
Aug 1, 2002
Heng-Seng Huang
H01 - BASIC ELECTRIC ELEMENTS