Sidney E. Buttrill JR.

Person

Palo Alto, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for two-dimensional mobility based filtering of...
- Patent number 12,163,920
- Issue date Dec 10, 2024
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for two-dimensional mobility based filtering of...
- Patent number 11,662,333
- Issue date May 30, 2023
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Depressed anode with plasmon-enabled devices such as ultra-small re...
- Patent number 7,791,053
- Issue date Sep 7, 2010
- Virgin Islands Microsystems, Inc.
- Sidney E. Buttrill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer system and method for transporting and analyzing...
- Patent number 5,818,041
- Issue date Oct 6, 1998
- Varian Associates, Inc.
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating an ion trap mass spectrometer
- Patent number 5,793,038
- Issue date Aug 11, 1998
- Varian Associates, Inc.
- Sidney E. Buttrill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for injection of externally produced ions into a quadrupole...
- Patent number 5,729,014
- Issue date Mar 17, 1998
- Varian Associates, Inc.
- Alex Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer system and method for transporting and analyzing...
- Patent number 5,672,868
- Issue date Sep 30, 1997
- Varian Associates, Inc.
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for and method of forming a parallel ion beam
- Patent number 5,569,917
- Issue date Oct 29, 1996
- Varian Associates, Inc.
- Sidney E. Buttrill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Means for reducing the contamination of mass spectrometer leak dete...
- Patent number 5,506,412
- Issue date Apr 9, 1996
- Sidney E. Buttrill
- G01 - MEASURING TESTING
Information Patent Grant
Quadruple ion trap method having improved sensitivity
- Patent number 5,300,772
- Issue date Apr 5, 1994
- Varian Associates, Inc.
- Sidney E. Buttrill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for surface diagnostics
- Patent number 4,733,073
- Issue date Mar 22, 1988
- SRI International
- Christopher H. Becker
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Ions Funnels Having Improved Pressure Distribution and Flow Charact...
- Publication number 20230052193
- Publication date Feb 16, 2023
- MOBILion Systems, Inc.
- Serguei Krioutchkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Funnels Having Improved Pressure Distribution and Flow Characte...
- Publication number 20230008420
- Publication date Jan 12, 2023
- MOBILion Systems, Inc.
- Serguei Krioutchkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Two-Dimensional Mobility Based Filtering o...
- Publication number 20220074891
- Publication date Mar 10, 2022
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Two-Dimensional Mobility Based Filtering of...
- Publication number 20210310989
- Publication date Oct 7, 2021
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Depressed Anode With Plasmon-Enabled Devices Such As Ultra-Small Re...
- Publication number 20090230332
- Publication date Sep 17, 2009
- Virgin Islands Microsystems, Inc.
- Sidney E. Buttrill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electric sector time-of-flight mass spectrometer with adjustable io...
- Publication number 20080128613
- Publication date Jun 5, 2008
- Bio-Rad Laboratories, Inc.
- Sidney E. Buttrill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electric sector time-of-flight mass spectrometer with adjustable io...
- Publication number 20050224708
- Publication date Oct 13, 2005
- Ciphergen Biosystems, Inc.
- Sidney E. Buttrill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electric sector time-of-flight mass spectrometer with adjustable io...
- Publication number 20040149901
- Publication date Aug 5, 2004
- Ciphergen Biosystems, Inc.
- Sidney E. Buttrill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC SECTOR TIME-OF-FLIGHT MASS SPECTROMETER WITH ADJUSTABLE IO...
- Publication number 20040056190
- Publication date Mar 25, 2004
- Ciphergen Biosystems, Inc.
- Sidney E. Buttrill
- H01 - BASIC ELECTRIC ELEMENTS

Sidney E. Buttrill JR.

Person

Patents Grantslast 30 patents

Systems and methods for two-dimensional mobility based filtering of...

Systems and methods for two-dimensional mobility based filtering of...

Depressed anode with plasmon-enabled devices such as ultra-small re...

Mass spectrometer system and method for transporting and analyzing...

Method of operating an ion trap mass spectrometer

Method for injection of externally produced ions into a quadrupole...

Mass spectrometer system and method for transporting and analyzing...

Apparatus for and method of forming a parallel ion beam

Means for reducing the contamination of mass spectrometer leak dete...

Quadruple ion trap method having improved sensitivity

Method and apparatus for surface diagnostics

Patents Applicationslast 30 patents

Ions Funnels Having Improved Pressure Distribution and Flow Charact...

Ion Funnels Having Improved Pressure Distribution and Flow Characte...

Systems and Methods for Two-Dimensional Mobility Based Filtering o...

Systems and Methods for Two-Dimensional Mobility Based Filtering of...

Depressed Anode With Plasmon-Enabled Devices Such As Ultra-Small Re...

Electric sector time-of-flight mass spectrometer with adjustable io...

Electric sector time-of-flight mass spectrometer with adjustable io...

Electric sector time-of-flight mass spectrometer with adjustable io...

ELECTRIC SECTOR TIME-OF-FLIGHT MASS SPECTROMETER WITH ADJUSTABLE IO...